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Browsing "Department of Electrical & Electronic Engineering" by Author deng, f
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Showing results 1 to 9 of 9
Title
Author(s)
Issue Date
An edge-from-focus approach to 3D inspection and metrology
Proceeding/Conference:
Proceedings of SPIE
Deng, F
Chen, J
Liu, J
Zhang, Z
Deng, J
Fung, KSM
Lam, EY
2015
An INSPECT Measurement System for Moving Objects
Journal:
IEEE Transactions on Instrumentation and Measurement
Deng, F
Liu, C
Sze, W
Deng, J
Fung, S
Lam, EYM
2015
An edge detection algorithm based on rectangular gaussian kernels for machine vision applications
Proceeding/Conference:
Proceedings of SPIE - The International Society for Optical Engineering
Deng, F
Fung, KSM
Deng, J
Lam, EY
2009
An elliptic phase-shift algorithm for high speed three-dimensional profilometry
Proceeding/Conference:
Proceedings of SPIE - The International Society for Optical Engineering
Deng, F
Li, Z
Chen, J
Deng, J
Fung, KSM
Lam, EY
2013
An illumination-invariant phase-shifting algorithm for three-dimensional profilometry
Proceeding/Conference:
Proceedings of SPIE - The International Society for Optical Engineering
Deng, F
Liu, C
Sze, W
Deng, J
Fung, KSM
Leung, WH
Lam, EY
2012
Illumination-invariant phase-shifting algorithm for three-dimensional profilometry of a moving object
Journal:
Optical Engineering
Deng, F
Liu, C
Sze, W
Deng, J
Fung, K
Leung, W
Lam, EYM
2012
A polynomial phase-shift algorithm for high precision three-dimensional profilometry
Proceeding/Conference:
Proceedings of SPIE - The International Society for Optical Engineering
Deng, F
Liu, C
Sze, W
Deng, J
Fung, KSM
Lam, EY
2013
Regularized multiframe phase-shifting algorithm for three-dimensional profilometry
Journal:
Applied Optics
Deng, F
Sze, WF
Deng, J
Fung, KSM
Leung, WH
Lam, EY
2012
A three-dimensional imaging system for surface profilometry of moving objects
Proceeding/Conference:
IEEE International Workshop on Imaging Systems and Techniques Proceedings
Deng, F
Liu, J
Deng, J
Fung, KSM
Lam, EY
2013