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- Publisher Website: 10.1109/IST.2013.6729718
- Scopus: eid_2-s2.0-84894434503
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Conference Paper: A three-dimensional imaging system for surface profilometry of moving objects
Title | A three-dimensional imaging system for surface profilometry of moving objects |
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Authors | |
Keywords | Industrial inspection Profilometry Surface measurement Three-dimensional image acquisition |
Issue Date | 2013 |
Publisher | IEEE. The Journal's web site is located at http://ieeexplore.ieee.org/xpl/conhome.jsp?punumber=1001148 |
Citation | The 2013 IEEE International Conference on Imaging Systems and Techniques (IST 2013), Beijing, China, 22-23 October 2013. In Conference Proceedings, 2013, p. 343-347 How to Cite? |
Abstract | Non-contact optical imaging system design and the corresponding surface profilometry algorithm are critical components in various metrology applications, such as surface inspection of semiconductor components on the production line. For such challenging industrial applications, the most important considerations are often automation, precision and speed of the inspection. In this work, we propose a mathematical framework and a dynamic phase-shift algorithm (D-PSA) for a dense surface profilometry of moving objects. We also present a fringe pattern projection system with projector and camera arrays, with an aim to reduce the undesirable effects such as the uneven illumination and the perspective geometry effect on the reconstructed surface using a large field-of-view inspection system. This system is then applied to the inspection of the surface of moving printed circuit boards along a conveyor belt. Experimental results show that our approach can reconstruct the object surface effectively and efficiently. © 2013 IEEE. |
Persistent Identifier | http://hdl.handle.net/10722/201231 |
ISBN |
DC Field | Value | Language |
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dc.contributor.author | Deng, F | en_US |
dc.contributor.author | Liu, J | en_US |
dc.contributor.author | Deng, J | en_US |
dc.contributor.author | Fung, KSM | en_US |
dc.contributor.author | Lam, EY | en_US |
dc.date.accessioned | 2014-08-21T07:18:17Z | - |
dc.date.available | 2014-08-21T07:18:17Z | - |
dc.date.issued | 2013 | en_US |
dc.identifier.citation | The 2013 IEEE International Conference on Imaging Systems and Techniques (IST 2013), Beijing, China, 22-23 October 2013. In Conference Proceedings, 2013, p. 343-347 | en_US |
dc.identifier.isbn | 978-1-4673-5791-3 | - |
dc.identifier.uri | http://hdl.handle.net/10722/201231 | - |
dc.description.abstract | Non-contact optical imaging system design and the corresponding surface profilometry algorithm are critical components in various metrology applications, such as surface inspection of semiconductor components on the production line. For such challenging industrial applications, the most important considerations are often automation, precision and speed of the inspection. In this work, we propose a mathematical framework and a dynamic phase-shift algorithm (D-PSA) for a dense surface profilometry of moving objects. We also present a fringe pattern projection system with projector and camera arrays, with an aim to reduce the undesirable effects such as the uneven illumination and the perspective geometry effect on the reconstructed surface using a large field-of-view inspection system. This system is then applied to the inspection of the surface of moving printed circuit boards along a conveyor belt. Experimental results show that our approach can reconstruct the object surface effectively and efficiently. © 2013 IEEE. | - |
dc.language | eng | en_US |
dc.publisher | IEEE. The Journal's web site is located at http://ieeexplore.ieee.org/xpl/conhome.jsp?punumber=1001148 | - |
dc.relation.ispartof | IEEE International Workshop on Imaging Systems and Techniques Proceedings | en_US |
dc.subject | Industrial inspection | - |
dc.subject | Profilometry | - |
dc.subject | Surface measurement | - |
dc.subject | Three-dimensional image acquisition | - |
dc.title | A three-dimensional imaging system for surface profilometry of moving objects | en_US |
dc.type | Conference_Paper | en_US |
dc.identifier.email | Lam, EY: elam@eee.hku.hk | en_US |
dc.identifier.authority | Lam, EY=rp00131 | en_US |
dc.description.nature | link_to_subscribed_fulltext | - |
dc.identifier.doi | 10.1109/IST.2013.6729718 | - |
dc.identifier.scopus | eid_2-s2.0-84894434503 | - |
dc.identifier.hkuros | 233704 | en_US |
dc.identifier.spage | 343 | - |
dc.identifier.epage | 347 | - |
dc.publisher.place | United States | - |
dc.customcontrol.immutable | sml 140826 | - |