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Patent History
- ApplicationUS 10/300323 2002-11-20
- PublicationUS 2003094034 2003-05-22
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published patent: Method for measuring elastic properties
Title | Method for measuring elastic properties |
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Priority Date | 2002-11-20 US 10/300323 2001-11-20 US 09/331751P |
Inventors | |
Issue Date | 2003 |
Citation | US Published patent application US 2003094034. Washington, DC: US Patent and Trademark Office (USPTO), 2003 How to Cite? |
Abstract | This invention relates to a method for measuring elastic modulus of a sample object. This invention also relates to a method for correcting creep effects in the modulus measurement. The error due to creep in the apparent contact compliance is equal to the ratio of the indenter displacement rate at the end of the load hold to the unloading rate. Determination of this error term and deduction of it from the measured contact compliance can be easily done at a low cost by modifying the data analysis software in any commercial depth-sensing indentation system. |
Persistent Identifier | http://hdl.handle.net/10722/176837 |
DC Field | Value | Language |
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dc.date.accessioned | 2012-11-30T08:38:34Z | - |
dc.date.available | 2012-11-30T08:38:34Z | - |
dc.date.issued | 2003 | - |
dc.identifier.citation | US Published patent application US 2003094034. Washington, DC: US Patent and Trademark Office (USPTO), 2003 | en_HK |
dc.identifier.uri | http://hdl.handle.net/10722/176837 | - |
dc.description.abstract | This invention relates to a method for measuring elastic modulus of a sample object. This invention also relates to a method for correcting creep effects in the modulus measurement. The error due to creep in the apparent contact compliance is equal to the ratio of the indenter displacement rate at the end of the load hold to the unloading rate. Determination of this error term and deduction of it from the measured contact compliance can be easily done at a low cost by modifying the data analysis software in any commercial depth-sensing indentation system. | en_HK |
dc.relation.isreferencedby | WO 2011124984 (A3) 2012-01-05 | en_HK |
dc.relation.isreferencedby | WO 2011124984 (A2) 2011-10-13 | en_HK |
dc.relation.isreferencedby | WO 2011124955 (A1) 2011-10-13 | en_HK |
dc.title | Method for measuring elastic properties | en_HK |
dc.type | Patent | en_US |
dc.description.nature | published_or_final_version | en_US |
dc.contributor.inventor | Feng Gang | en_HK |
dc.contributor.inventor | Ngan, AHW | en_HK |
patents.identifier.application | US 10/300323 | en_HK |
patents.description.assignee | FENG GANG, ; NGAN ALFONSO HING WAN, ; THE UNIVERSITY OF HONG KONG | en_HK |
patents.description.country | United States of America | en_HK |
patents.date.publication | 2003-05-22 | en_HK |
patents.date.application | 2002-11-20 | en_HK |
patents.date.priority | 2002-11-20 US 10/300323 | en_HK |
patents.date.priority | 2001-11-20 US 09/331751P | en_HK |
patents.description.cc | US | en_HK |
patents.identifier.publication | US 2003094034 | en_HK |
patents.relation.family | EP 1314970 (A2) 2003-05-28 | en_HK |
patents.relation.family | US 2003094034 (A1) 2003-05-22 | en_HK |
patents.relation.family | US 6883367 (B2) 2005-04-26 | en_HK |
patents.relation.family | US 2005066702 (A1) 2005-03-31 | en_HK |
patents.description.kind | A1 | en_HK |
patents.type | Patent_published | en_HK |