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  Patent History
  • Application
    HK 20020104647 2002-06-21
  • Publication
    US 20120226759 2012-09-06
  • Granted
    HK 1042944 2009-01-30

granted patent: Method Of And Device For Inspecting Images To Detect Defects

TitleMethod Of And Device For Inspecting Images To Detect Defects
Granted PatentHK 1042944
Granted Date2009-01-30
Priority Date2000-04-18 US 09/197708P
Inventors
Issue Date2009
Citation
Hong Kong Patent 1042944. Hong Kong, PRC: Intellectual Property Office of the Governmemnt of the Hong Kong Special Administration Region., 2009 How to Cite?
AbstractThe Present Invention Relates To A Method For Automated Defect Detection In Textured Materials. The Present Invention Utilizes Linear Finite Impulse Response (Fir) Filters With Optimized Energy Separation. Specifically, The Invention Provides A Method Of Inspecting Industrial Products For Defects. The Method Has Steps Of: Automated Design Of Optimized Filters From Samples Of Products, Using These Optimal Filters To Filter The Acquired Images Of Product Under Inspection, Computing The Energy Of Each Pixel In A Local Region, And Finally Segmenting The Defect By Thresholding Each Pixel. The Present Invention Also Relates To A Method Of Inspection Of Unknown (Unsupervised) Defects In Web Materials. In An Unsupervised Inspection, Information From A Finite Number Of Optimal Filters Is Combined Using A Data Fusion Module.; This Module Attempts To Nullify The False Alarm Associated With The Information Arriving From Different Channels.
Persistent Identifierhttp://hdl.handle.net/10722/173795

 

DC FieldValueLanguage
dc.date.accessioned2012-11-02T06:19:24Z-
dc.date.available2012-11-02T06:19:24Z-
dc.date.issued2009-
dc.identifier.citationHong Kong Patent 1042944. Hong Kong, PRC: Intellectual Property Office of the Governmemnt of the Hong Kong Special Administration Region., 2009en_HK
dc.identifier.urihttp://hdl.handle.net/10722/173795-
dc.description.abstractThe Present Invention Relates To A Method For Automated Defect Detection In Textured Materials. The Present Invention Utilizes Linear Finite Impulse Response (Fir) Filters With Optimized Energy Separation. Specifically, The Invention Provides A Method Of Inspecting Industrial Products For Defects. The Method Has Steps Of: Automated Design Of Optimized Filters From Samples Of Products, Using These Optimal Filters To Filter The Acquired Images Of Product Under Inspection, Computing The Energy Of Each Pixel In A Local Region, And Finally Segmenting The Defect By Thresholding Each Pixel. The Present Invention Also Relates To A Method Of Inspection Of Unknown (Unsupervised) Defects In Web Materials. In An Unsupervised Inspection, Information From A Finite Number Of Optimal Filters Is Combined Using A Data Fusion Module.; This Module Attempts To Nullify The False Alarm Associated With The Information Arriving From Different Channels.en_HK
dc.titleMethod Of And Device For Inspecting Images To Detect Defectsen_HK
dc.typePatenten_US
dc.identifier.emailPang, GKH=gpang@eee.hku.hk-
dc.identifier.authorityPang, GKH:rp00162-
dc.contributor.inventorPang, GKH-
dc.contributor.inventorKumar, A-
patents.identifier.applicationHK 20020104647en_HK
patents.identifier.grantedHK 1042944en_HK
patents.description.assigneeUniv Hong Kong [Hk]en_HK
patents.description.countryHong Kong (S.A.R.)en_HK
patents.date.publication2012-09-06en_HK
patents.date.granted2009-01-30en_HK
patents.identifier.hkutechidEEE-2000-00032-2en_HK
patents.date.application2002-06-21en_HK
patents.date.priority2000-04-18 US 09/197708Pen_HK
patents.description.ccHKen_HK
patents.identifier.publicationUS 20120226759en_HK
patents.relation.familyCN 1335496 (A) 2002-02-13en_HK
patents.relation.familyCN 100401043 (C) 2008-07-09en_HK
patents.relation.familyDE 60115314 (T2) 2006-08-03en_HK
patents.relation.familyEP 1148332 (A2) 2001-10-24en_HK
patents.relation.familyHK 1042944 (A1) 2009-01-30en_HK
patents.relation.familyUS 2002054293 (A1) 2002-05-09en_HK
patents.relation.familyUS 6804381 (B2) 2004-10-12en_HK
patents.description.kindA1en_HK
patents.typePatent_granteden_HK

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