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Patent History
- ApplicationHK 20020104647 2002-06-21
- PublicationUS 20120226759 2012-09-06
- GrantedHK 1042944 2009-01-30
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granted patent: Method Of And Device For Inspecting Images To Detect Defects
Title | Method Of And Device For Inspecting Images To Detect Defects |
---|---|
Granted Patent | HK 1042944 |
Granted Date | 2009-01-30 |
Priority Date | 2000-04-18 US 09/197708P |
Inventors | |
Issue Date | 2009 |
Citation | Hong Kong Patent 1042944. Hong Kong, PRC: Intellectual Property Office of the Governmemnt of the Hong Kong Special Administration Region., 2009 How to Cite? |
Abstract | The Present Invention Relates To A Method For Automated Defect Detection In Textured Materials. The Present Invention Utilizes Linear Finite Impulse Response (Fir) Filters With Optimized Energy Separation. Specifically, The Invention Provides A Method Of Inspecting Industrial Products For Defects. The Method Has Steps Of: Automated Design Of Optimized Filters From Samples Of Products, Using These Optimal Filters To Filter The Acquired Images Of Product Under Inspection, Computing The Energy Of Each Pixel In A Local Region, And Finally Segmenting The Defect By Thresholding Each Pixel. The Present Invention Also Relates To A Method Of Inspection Of Unknown (Unsupervised) Defects In Web Materials. In An Unsupervised Inspection, Information From A Finite Number Of Optimal Filters Is Combined Using A Data Fusion Module.; This Module Attempts To Nullify The False Alarm Associated With The Information Arriving From Different Channels. |
Persistent Identifier | http://hdl.handle.net/10722/173795 |
DC Field | Value | Language |
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dc.date.accessioned | 2012-11-02T06:19:24Z | - |
dc.date.available | 2012-11-02T06:19:24Z | - |
dc.date.issued | 2009 | - |
dc.identifier.citation | Hong Kong Patent 1042944. Hong Kong, PRC: Intellectual Property Office of the Governmemnt of the Hong Kong Special Administration Region., 2009 | en_HK |
dc.identifier.uri | http://hdl.handle.net/10722/173795 | - |
dc.description.abstract | The Present Invention Relates To A Method For Automated Defect Detection In Textured Materials. The Present Invention Utilizes Linear Finite Impulse Response (Fir) Filters With Optimized Energy Separation. Specifically, The Invention Provides A Method Of Inspecting Industrial Products For Defects. The Method Has Steps Of: Automated Design Of Optimized Filters From Samples Of Products, Using These Optimal Filters To Filter The Acquired Images Of Product Under Inspection, Computing The Energy Of Each Pixel In A Local Region, And Finally Segmenting The Defect By Thresholding Each Pixel. The Present Invention Also Relates To A Method Of Inspection Of Unknown (Unsupervised) Defects In Web Materials. In An Unsupervised Inspection, Information From A Finite Number Of Optimal Filters Is Combined Using A Data Fusion Module.; This Module Attempts To Nullify The False Alarm Associated With The Information Arriving From Different Channels. | en_HK |
dc.title | Method Of And Device For Inspecting Images To Detect Defects | en_HK |
dc.type | Patent | en_US |
dc.identifier.email | Pang, GKH=gpang@eee.hku.hk | - |
dc.identifier.authority | Pang, GKH:rp00162 | - |
dc.contributor.inventor | Pang, GKH | - |
dc.contributor.inventor | Kumar, A | - |
patents.identifier.application | HK 20020104647 | en_HK |
patents.identifier.granted | HK 1042944 | en_HK |
patents.description.assignee | Univ Hong Kong [Hk] | en_HK |
patents.description.country | Hong Kong (S.A.R.) | en_HK |
patents.date.publication | 2012-09-06 | en_HK |
patents.date.granted | 2009-01-30 | en_HK |
patents.identifier.hkutechid | EEE-2000-00032-2 | en_HK |
patents.date.application | 2002-06-21 | en_HK |
patents.date.priority | 2000-04-18 US 09/197708P | en_HK |
patents.description.cc | HK | en_HK |
patents.identifier.publication | US 20120226759 | en_HK |
patents.relation.family | CN 1335496 (A) 2002-02-13 | en_HK |
patents.relation.family | CN 100401043 (C) 2008-07-09 | en_HK |
patents.relation.family | DE 60115314 (T2) 2006-08-03 | en_HK |
patents.relation.family | EP 1148332 (A2) 2001-10-24 | en_HK |
patents.relation.family | HK 1042944 (A1) 2009-01-30 | en_HK |
patents.relation.family | US 2002054293 (A1) 2002-05-09 | en_HK |
patents.relation.family | US 6804381 (B2) 2004-10-12 | en_HK |
patents.description.kind | A1 | en_HK |
patents.type | Patent_granted | en_HK |