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Patent History
- ApplicationEP20010109375 2001-04-18
- PublicationEP 1148332 2005-11-30
- Granted1148332 2005-11-30
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published patent: Method of inspecting images to detect defects
Title | Method of inspecting images to detect defects |
---|---|
Granted Patent | 1148332 |
Granted Date | 2005-11-30 |
Priority Date | 2000-04-18 US 09/197708P |
Inventors | |
Issue Date | 2005 |
Citation | EP Published Patent application EP 1148332. European Patent Office (EPO), Escapenet, 2005 How to Cite? |
Abstract | The present invention relates to a method for automated defect detection in textured materials. The present invention utilizes linear Finite Impulse Response (FIR) filters with optimized energy separation. Specifically, the invention provides a method of inspecting industrial products for defects. The method has steps of: automated design of optimized filters from samples of products, using these optimal filters to filter the acquired images of product under inspection, computing the energy of each pixel in a local region, and finally segmenting the defect by thresholding each pixel. The present invention also relates to a method of inspection of unknown (unsupervised) defects in web materials. In an unsupervised inspection, information from a finite number of optimal filters is combined using a data fusion module.; This module attempts to nullify the false alarm associated with the information arriving from different channels. |
Persistent Identifier | http://hdl.handle.net/10722/142127 |
DC Field | Value | Language |
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dc.date.accessioned | 2011-10-19T06:30:03Z | - |
dc.date.available | 2011-10-19T06:30:03Z | - |
dc.date.issued | 2005 | - |
dc.identifier.citation | EP Published Patent application EP 1148332. European Patent Office (EPO), Escapenet, 2005 | en_HK |
dc.identifier.uri | http://hdl.handle.net/10722/142127 | - |
dc.description.abstract | The present invention relates to a method for automated defect detection in textured materials. The present invention utilizes linear Finite Impulse Response (FIR) filters with optimized energy separation. Specifically, the invention provides a method of inspecting industrial products for defects. The method has steps of: automated design of optimized filters from samples of products, using these optimal filters to filter the acquired images of product under inspection, computing the energy of each pixel in a local region, and finally segmenting the defect by thresholding each pixel. The present invention also relates to a method of inspection of unknown (unsupervised) defects in web materials. In an unsupervised inspection, information from a finite number of optimal filters is combined using a data fusion module.; This module attempts to nullify the false alarm associated with the information arriving from different channels. | en_HK |
dc.relation.isreferencedby | AT 507939 (A1) 2010-09-15 | en_HK |
dc.relation.isreferencedby | AT 507939 (B1) 2012-02-15 | en_HK |
dc.title | Method of inspecting images to detect defects | en_HK |
dc.type | Patent | en_US |
dc.identifier.email | Pang, Grantham Kwok Hung:gpang@eee.hku.hk | en_US |
dc.identifier.authority | Pang, Grantham Kwok Hung=rp00162 | en_US |
dc.description.nature | published_or_final_version | - |
dc.contributor.inventor | PANG, KWOK-HUNG GRANTHAM | en_HK |
dc.contributor.inventor | KUMAR, AIAY | en_HK |
patents.identifier.application | EP20010109375 | en_HK |
patents.identifier.granted | 1148332 | en_US |
patents.description.assignee | UNIV HONG KONG [CN] | en_HK |
patents.description.country | European Patent Office | en_HK |
patents.date.publication | 2005-11-30 | en_HK |
patents.date.granted | 2005-11-30 | en_US |
patents.identifier.hkutechid | EEE-2000-00032-3 | en_US |
patents.identifier.hkutechid | EEE-2000-00032-4 | - |
patents.identifier.hkutechid | EEE-2000-00032-5 | - |
patents.identifier.hkutechid | EEE-2000-00032-6 | - |
patents.date.application | 2001-04-18 | en_HK |
patents.date.priority | 2000-04-18 US 09/197708P | en_HK |
patents.description.cc | EP | en_HK |
patents.identifier.publication | EP 1148332 | en_HK |
patents.relation.family | CN 1335496 (A) 2002-02-13 | en_HK |
patents.relation.family | CN 100401043 (C) 2008-07-09 | en_HK |
patents.relation.family | DE 60115314 (T2) 2006-08-03 | en_HK |
patents.relation.family | HK 1042944 (A1) 2009-01-30 | en_HK |
patents.relation.family | US 2002054293 (A1) 2002-05-09 | en_HK |
patents.relation.family | US 6804381 (B2) 2004-10-12 | en_HK |
patents.description.kind | B1 | en_HK |
patents.type | Patent_published | en_HK |