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Title	Author(s)	Issue Date
1.2-kV Vertical GaN Fin-JFETs: High-Temperature Characteristics and Avalanche Capability Journal:IEEE Transactions on Electron Devices	Liu, Jingcun Xiao, Ming Zhang, Ruizhe Pidaparthi, Subhash Cui, Hao Edwards, Andrew Craven, Michael Baubutr, Lek Drowley, Cliff Zhang, Yuhao	2021
Accelerating the Recovery of p-Gate GaN HEMTs after Overvoltage Stresses Proceeding/Conference:IEEE International Reliability Physics Symposium Proceedings	Kozak, Joseph P.Song, Qihao Liu, Jingcun Zhang, Ruizhe Li, Qiang Saito, Wataru Zhang, Yuhao	2022
Breakthrough Short Circuit Robustness Demonstrated in Vertical GaN Fin JFET Journal:IEEE Transactions on Power Electronics	Zhang, Ruizhe Liu, Jingcun Li, Qiang Pidaparthi, Subhash Edwards, Andrew Drowley, Cliff Zhang, Yuhao	2022
Degradation and Recovery of GaN HEMTs in Overvoltage Hard Switching Near Breakdown Voltage Journal:IEEE Transactions on Power Electronics	Kozak, Joseph P.Song, Qihao Zhang, Ruizhe Ma, Yunwei Liu, Jingcun Li, Qiang Saito, Wataru Zhang, Yuhao	2023
Degradation of SiC MOSFETs Under High-Bias Switching Events Journal:IEEE Journal of Emerging and Selected Topics in Power Electronics	Kozak, Joseph P.Zhang, Ruizhe Liu, Jingcun Ngo, Khai D.T.Zhang, Yuhao	2022
Failure Mechanisms of Cascode GaN HEMTs under Overvoltage and Surge Energy Events Proceeding/Conference:IEEE International Reliability Physics Symposium Proceedings	Song, Qihao Zhang, Ruizhe Kozak, Joseph P.Liu, Jingcun Li, Qiang Zhang, Yuhao	2021
GaN MIS-HEMTs in Repetitive Overvoltage Switching: Parametric Shift and Recovery Proceeding/Conference:IEEE International Reliability Physics Symposium Proceedings	Song, Qihao Kozak, Joseph P.Ma, Yunwei Liu, Jingcun Zhang, Ruizhe Volkov, Roman Sherman, Daniel Smith, Kurt V.Saito, Wataru Zhang, Yuhao	2022
Hard-Switched Overvoltage Robustness of p-Gate GaN HEMTs at Increasing Temperatures Proceeding/Conference:ECCE 2020 - IEEE Energy Conversion Congress and Exposition	Kozak, Joseph P.Zhang, Ruizhe Liu, Jingcun Song, Qihao Xiao, Ming Zhang, Yuhao	2020
Packaged Ga<inf>2</inf>O<inf>3</inf>Schottky Rectifiers with over 60-A Surge Current Capability Journal:IEEE Transactions on Power Electronics	Xiao, Ming Wang, Boyan Liu, Jingcun Zhang, Ruizhe Zhang, Zichen Ding, Chao Lu, Shengchang Sasaki, Kohei Lu, Guo Quan Buttay, Cyril Zhang, Yuhao	2021
Physics of Degradation in SiC MOSFETs Stressed by Overvoltage and Overcurrent Switching Proceeding/Conference:IEEE International Reliability Physics Symposium Proceedings	Kozak, Joseph P.Zhang, Ruizhe Liu, Jingcun Ngo, Khai D.T.Zhang, Yuhao	2020
Robust Through-Fin Avalanche in Vertical GaN Fin-JFET with Soft Failure Mode Journal:IEEE Electron Device Letters	Zhang, Ruizhe Liu, Jingcun Li, Qiang Pidaparthi, Subhash Edwards, Andrew Drowley, Cliff Zhang, Yuhao	2022
Robustness of Cascode GaN HEMTs in Unclamped Inductive Switching Journal:IEEE Transactions on Power Electronics	Song, Qihao Zhang, Ruizhe Kozak, Joseph Liu, Jingcun Li, Qiang Zhang, Yuhao	2022
Robustness of cascode GaN HEMTs under repetitive overvoltage and surge energy stresses Proceeding/Conference:Conference Proceedings - IEEE Applied Power Electronics Conference and Exposition - APEC	Song, Qihao Zhang, Ruizhe Kozak, Joseph P.Liu, Jingcun Li, Qiang Zhang, Yuhao	2021
Robustness of GaN Gate Injection Transistors under Repetitive Surge Energy and Overvoltage Proceeding/Conference:IEEE International Reliability Physics Symposium Proceedings	Kozak, Joseph P.Song, Qihao Zhang, Ruizhe Liu, Jingcun Zhang, Yuhao	2021
Stability, Reliability, and Robustness of GaN Power Devices: A Review Journal:IEEE Transactions on Power Electronics	Kozak, Joseph Peter Zhang, Ruizhe Porter, Matthew Song, Qihao Liu, Jingcun Wang, Bixuan Wang, Rudy Saito, Wataru Zhang, Yuhao	2023
Surge Current and Avalanche Ruggedness of 1.2-kV Vertical GaN p-n Diodes Journal:IEEE Transactions on Power Electronics	Liu, Jingcun Zhang, Ruizhe Xiao, Ming Pidaparthi, Subhash Cui, Hao Edwards, Andrew Baubutr, Lek Drowley, Cliff Zhang, Yuhao	2021
Surge Current Interruption Capability of Discrete IGBT Devices in DC Hybrid Circuit Breakers Journal:IEEE Journal of Emerging and Selected Topics in Power Electronics	Ravi, Lakshmi Liu, Jian Liu, Jingcun Zhang, Yuhao Buttay, Cyril Schmalz, Steven Burgos, Rolando Dong, Dong	2023
Surge Energy Robustness of GaN Gate Injection Transistors Proceeding/Conference:IEEE International Reliability Physics Symposium Proceedings	Zhang, Ruizhe Kozak, Joseph P.Liu, Jingcun Xiao, Ming Zhang, Yuhao	2020
Surge-Energy and Overvoltage Ruggedness of P-Gate GaN HEMTs Journal:IEEE Transactions on Power Electronics	Zhang, Ruizhe Kozak, Joseph P.Xiao, Ming Liu, Jingcun Zhang, Yuhao	2020
Third Quadrant Conduction Loss of 1.2-10 kV SiC MOSFETs: Impact of Gate Bias Control Journal:IEEE Transactions on Power Electronics	Zhang, Ruizhe Lin, Xiang Liu, Jingcun Mocevic, Slavko Dong, Dong Zhang, Yuhao	2021

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