Showing results 1 to 3 of 3
| Title | Author(s) | Issue Date | |
|---|---|---|---|
A study of nano-indentation test using rhombus-shaped cantilever in atomic force microscope Proceeding/Conference:Key Engineering Materials | 2006 | ||
Force-calibrated AFM with rhombus-shaped cantilever for bending test of micro/nanoscale thin films Proceeding/Conference:The 13th International Conference on Solid-State Sensors, Actuators and Microsystems, 2005. Digest of Technical Papers. TRANSDUCERS '05. | 2005 | ||
Multi-functioning AFM cantilever for mechanical tests: Indentation, strip bending and adhesion tests Proceeding/Conference:19th IEEE International Conference on Micro Electro Mechanical Systems | 2006 |