Showing results 1 to 4 of 4
| Title | Author(s) | Issue Date | |
|---|---|---|---|
A study of nano-indentation test using rhombus-shaped cantilever in atomic force microscope Proceeding/Conference:Key Engineering Materials | 2006 | ||
Force-calibrated AFM for mechanical test of freestanding thin films Proceeding/Conference:Key Engineering Materials | 2005 | ||
Force-calibrated AFM with rhombus-shaped cantilever for bending test of micro/nanoscale thin films Proceeding/Conference:The 13th International Conference on Solid-State Sensors, Actuators and Microsystems, 2005. Digest of Technical Papers. TRANSDUCERS '05. | 2005 | ||
Symmetric AFM cantilever for mechanical characterization of Mo thin film Proceeding/Conference:International Journal of Modern Physics B | 2006 |