Browsing by Author Asenov, A.

Jump to: 0-9 A B C D E F G H I J K L M N O P Q R S T U V W X Y Z
Showing results 1 to 7 of 7
TitleAuthor(s)Issue DateViews
A mobility model correction for 'atomistic' drift-diffusion simulation
Proceeding/Conference:International Conference on Simulation of Semiconductor Processes and Devices, SISPAD
2011
51
Analysis of silicon dioxide interface transition region in MOS structures
Proceeding/Conference:2007 International Conference on Simulation of Semiconductor Processes and Devices, SISPAD 2007
2007
41
2010
35
 
2012
54
Interplay between statistical reliability and variability: A comprehensive transistor-to-circuit simulation technology
Proceeding/Conference:IEEE International Reliability Physics Symposium Proceedings
2013
45
New reliability mechanisms in memory design for sub-22nm technologies
Proceeding/Conference:Proceedings of the 2011 IEEE 17th International On-Line Testing Symposium, IOLTS 2011
2011
59
On the sub-nm EOT scaling of high-κ gate stacks
Proceeding/Conference:ULIS 2008 - 9th International Conference on ULtimate Integration of Silicon
2008
35