Showing results 11 to 16 of 16
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Title | Author(s) | Issue Date | |
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Simplified closed-form trap-assisted tunneling model applied to nitrided oxide dielectric capacitors Journal:Journal of Applied Physics | 1992 | ||
Structural and defect characterization of GaAs and Al xGa 1-xAs grown at low temperature by molecular beam epitaxy Journal:Journal of Applied Physics | 1997 | ||
A study of the vacancy-defect distribution in a GaAs/Al xGa 1-xAs multi-layer structure grown at low temperature Journal:Journal of Crystal Growth | 1999 | ||
The influence of ion implantation on the off-state leakage characteristics of n-MOSFETs with ultrathin oxide, nitrided-oxide and re-oxidized nitrided-oxide gate dielectrics Proceeding/Conference:International Conference on VLSI and CAD Proceedings | 1993 | ||
Trap-assisted conduction in nitrided-oxide and re-oxidized nitrided-oxide n-channel metal-oxide-semiconductor field-effect transistors Journal:Journal of Applied Physics | 1993 | ||
1990 |