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TitleAuthor(s)Issue Date
 
2018
 
2004
 
2011
 
2008
 
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2017
Gate-leakage model of Ge MOS capacitor with high-k gate dielectric
Proceeding/Conference:ICSICT-2006: 2006 8th International Conference on Solid-State and Integrated Circuit Technology, Proceedings
2007
 
1997
 
2019
 
2006
 
2016
 
2018