Browsing by Author Cheng, YC

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TitleAuthor(s)Issue Date
 
Deep-depletion-layer impact-ionization-induced gate-oxide breakdown in thin-oxide n-MOSFETs
Journal:Solid-State Electronics
Huang, MQLai, PTMa, ZJWong, HCheng, YC
1993
 
Dynamic-stress-induced enhanced degradation of 1/f noise in n-MOSFET's
Journal:IEEE Transactions on Electron Devices
Xu, JPLai, PTCheng, YC
2000
 
An economical fabrication technique for SIMOX using plasma immersion ion implantation
Min, JChu, PKCheng, YCLiu, JBIyer, SSKCheung, NW
1995
 
Effects of Gate-Pulse Shape on the Accuracy of Charge-Pumping Measurement
Proceeding/Conference:International Conference on VLSI and CAD Proceedings
Lai, PTXu, JPPoek, CKCheng, YC
1997
 
Effects of hole trapping on degradation behaviors in thermally-nitrided oxides under F-N injection
Proceeding/Conference:Proceedings of the 3rd International Conference on Solid State and Integrated Circuit Technology
Lai, PTMa, ZJCheng, YCLiu, BYHuang, MQ
1992
 
Effects of nitridation and annealing on interface properties of thermally oxidized SiO2/SiC metal–oxide–semiconductor system
Journal:Applied Physics Letters
Lai, PTChakraborty, SChan, CLCheng, YC
2000
 
Effects of nitridation and re-oxidation on drain leakage current in n-channel MOSFETs
Proceeding/Conference:Conference on Solid State Devices and Materials
Fleischer, SLiu, ZHLai, PTMa, ZJCheng, YC
1990
 
Effects of nitridation temperature on the electron trap characteristics of nitrided-oxide metal-oxide-semiconductor capacitors
Journal:Journal of Applied Physics
Fleischer, SLai, PTCheng, YC
1993
 
Electrical characterization and simulation of substrate current in n-MOSFETs with nitrided/reoxidized-nitrided oxides as gate dielectrics
Journal:Solid-State Electronics
Ma, ZJLai, PTCheng, YC
1992
 
Electrical properties of different NO-annealed oxynitrides
Proceeding/Conference:Journal of Non-Crystalline Solids
Xu, JPLai, PTCheng, YC
1999
 
Electron trapping and detrapping behaviors of thin thermally nitrided oxides
Proceeding/Conference:Techical Digest of 1989 International Conference on VLSI and CAD (ICVC '89)
Lai, PTWong, HCheng, YCLo, HBLiu, ZH
1989
 
Energy levels of interface states generated in n-MOSFETs by hot-carrier stresses
Journal:Solid-State Electronics
Xu, JPLai, PTCheng, YC
2000
 
Enhancement of 1/f noise degradation in n-MOSFETs under AC hot-carrier stress
Proceeding/Conference:Proceedings of 15th International Conference Noise in Physical Systems and 1/f Fluctuations
Lai, PTXu, JCheng, YC
1999
 
Eriocalyxin B inhibits nuclear factor-κB activation by interfering with the binding of both p65 and p50 to the response element in a noncompetitive manner
Journal:Molecular Pharmacology
Leung, CHGrill, SPLam, WGao, WSun, HDCheng, YC
2006
 
Expression of deoxynucleotide carrier is not associated with the mitochondrial DNA depletion caused by anti-HIV dideoxynucleoside analogs and mitochondrial dNTP uptake
Journal:Molecular Pharmacology
Lam, WChen, CRuan, SLeung, CHCheng, YC
2005
 
Gate dielectrics prepared by double nitridation in NO and N2O
Journal:Applied Physics A: Materials Science and Processing
Xu, JPLai, PTCheng, YC
2000
 
Genome-wide biological response fingerprinting (BioReF) of the Chinese botanical formulation ISF-1 enables the selection of multiple marker genes as a potential metric for quality control
Journal:Journal of Ethnopharmacology
Rong, JTilton, RShen, JNg, KMLiu, CTam, PKHLau, ASYCheng, YC
2007
 
Greatly suppressed stress-induced shift of gate-induced drain leakage in N20-based n-MOSFET's
Journal:Solid-State Electronics
Xu, JLai, PTHuang, LLo, SHBCheng, YC
1999
 
Greatly suppressed stress-induced shift of GIDL in N 2O-based n-MOSFET's
Journal:Solid-State Electronics
Xu, JPLai, PTHuang, LLo, HBCheng, YC
1998
 
Histochemical Analysis of Medicinal Plants by Using Matrix-Assisted Laser Desorption / Ionization Mass Spectrometry
Proceeding/Conference:Meeting of Consortium for Globalization of Chinese Medicine, CGCM 2007
Tang, HWNg, KMLiang, ZTChe, CMCheng, YCZhao, ZZ
2007
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