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Conference Paper: Enhancement of 1/f noise degradation in n-MOSFETs under AC hot-carrier stress
Title | Enhancement of 1/f noise degradation in n-MOSFETs under AC hot-carrier stress |
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Authors | |
Issue Date | 1999 |
Publisher | Bentham. |
Citation | The 15th international conference on noise in physical systems and 1/f fluctuations, Hong Kong, China, 23-26 August 1999. In the Proceedings of 15th International Conference Noise in Physical Systems and 1/f Fluctuations, 1999 How to Cite? |
Persistent Identifier | http://hdl.handle.net/10722/204170 |
ISBN |
DC Field | Value | Language |
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dc.contributor.author | Lai, PT | en_US |
dc.contributor.author | Xu, J | en_US |
dc.contributor.author | Cheng, YC | en_US |
dc.date.accessioned | 2014-09-19T20:07:44Z | - |
dc.date.available | 2014-09-19T20:07:44Z | - |
dc.date.issued | 1999 | en_US |
dc.identifier.citation | The 15th international conference on noise in physical systems and 1/f fluctuations, Hong Kong, China, 23-26 August 1999. In the Proceedings of 15th International Conference Noise in Physical Systems and 1/f Fluctuations, 1999 | en_US |
dc.identifier.isbn | 9781874612285 | - |
dc.identifier.uri | http://hdl.handle.net/10722/204170 | - |
dc.language | eng | en_US |
dc.publisher | Bentham. | - |
dc.relation.ispartof | Proceedings of 15th International Conference Noise in Physical Systems and 1/f Fluctuations | en_US |
dc.title | Enhancement of 1/f noise degradation in n-MOSFETs under AC hot-carrier stress | en_US |
dc.type | Conference_Paper | en_US |
dc.identifier.email | Lai, PT: laip@eee.hku.hk | en_US |
dc.identifier.email | Xu, J: jpxu@eee.hku.hk | en_US |
dc.identifier.email | Cheng, YC: yccheng@hkucc.hku.hk | en_US |
dc.identifier.authority | Lai, PT=rp00130 | en_US |
dc.identifier.authority | Xu, J=rp00197 | en_US |
dc.identifier.hkuros | 240654 | en_US |
dc.publisher.place | London | - |