published patent: Method of and device for inspecting images to detect defects

TitleMethod of and device for inspecting images to detect defects
Priority Date2001-04-18 US 09/837065
2000-04-18 US 09/197708P
Inventors
Issue Date2002
Citation
US Published patent application US 2002054293. Washington, DC: US Patent and Trademark Office (USPTO), 2002 How to Cite?
AbstractThe present invention relates to a method for automated defect detection in textured materials. The present invention utilizes linear Finite Impulse Response (FIR) filters with optimized energy separation. Specifically, the invention provides a method of inspecting industrial products for defects. The method has steps of: automated design of optimized filters from samples of products, using these optimal filters to filter the acquired images of product under inspection, computing the energy of each pixel in a local region, and finally segmenting the defect by thresholding each pixel. The present invention also relates to a method of inspection of unknown (unsupervised) defects in web materials. In an unsupervised inspection, information from a finite number of optimal filters is combined using a data fusion module.; This module attempts to nullify the false alarm associated with the information arriving from different channels.
Persistent Identifierhttp://hdl.handle.net/10722/176821

 

DC FieldValueLanguage
dc.date.accessioned2012-11-30T08:38:32Z-
dc.date.available2012-11-30T08:38:32Z-
dc.date.issued2002-
dc.identifier.citationUS Published patent application US 2002054293. Washington, DC: US Patent and Trademark Office (USPTO), 2002en_HK
dc.identifier.urihttp://hdl.handle.net/10722/176821-
dc.description.abstractThe present invention relates to a method for automated defect detection in textured materials. The present invention utilizes linear Finite Impulse Response (FIR) filters with optimized energy separation. Specifically, the invention provides a method of inspecting industrial products for defects. The method has steps of: automated design of optimized filters from samples of products, using these optimal filters to filter the acquired images of product under inspection, computing the energy of each pixel in a local region, and finally segmenting the defect by thresholding each pixel. The present invention also relates to a method of inspection of unknown (unsupervised) defects in web materials. In an unsupervised inspection, information from a finite number of optimal filters is combined using a data fusion module.; This module attempts to nullify the false alarm associated with the information arriving from different channels.en_HK
dc.relation.isreferencedbyUS 8282552 (B2) 2012-10-09en_HK
dc.relation.isreferencedbyUS 2009131787 (A1) 2009-05-21en_HK
dc.relation.isreferencedbyUS 2009022391 (A1) 2009-01-22en_HK
dc.relation.isreferencedbyUS 8000501 (B2) 2011-08-16en_HK
dc.relation.isreferencedbyUS 2004245485 (A1) 2004-12-09en_HK
dc.relation.isreferencedbyUS 7601978 (B2) 2009-10-13en_HK
dc.relation.isreferencedbyUS 2003197857 (A1) 2003-10-23en_HK
dc.relation.isreferencedbyUS 7032208 (B2) 2006-04-18en_HK
dc.rightsCreative Commons: Attribution 3.0 Hong Kong License For Public Patent Documentsen_US
dc.titleMethod of and device for inspecting images to detect defectsen_HK
dc.typePatenten_US
dc.description.naturepublished_or_final_versionen_US
dc.contributor.inventorPang, GKHen_HK
dc.contributor.inventorKumar Ajayen_HK
patents.identifier.applicationUS 09/837065en_HK
patents.description.assigneePANG KWOK-HUNG GRANTHAM, ; KUMAR AJAY, ; THE UNIVERSITY OF HONG KONGen_HK
patents.description.countryUnited States of Americaen_HK
patents.date.publication2002-05-09en_HK
patents.date.application2001-04-18en_HK
patents.date.priority2001-04-18 US 09/837065en_HK
patents.date.priority2000-04-18 US 09/197708Pen_HK
patents.description.ccUSen_HK
patents.identifier.publicationUS 2002054293en_HK
patents.relation.familyCN 1335496 (A) 2002-02-13en_HK
patents.relation.familyCN 100401043 (C) 2008-07-09en_HK
patents.relation.familyDE 60115314 (T2) 2006-08-03en_HK
patents.relation.familyEP 1148332 (A2) 2001-10-24en_HK
patents.relation.familyHK 1042944 (A1) 2009-01-30en_HK
patents.relation.familyUS 2002054293 (A1) 2002-05-09en_HK
patents.relation.familyUS 6804381 (B2) 2004-10-12en_HK
patents.description.kindA1en_HK
patents.typePatent_publisheden_HK

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