Published Patent: Method of inspecting images to detect defects

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Patent History
  • Application
    EP20010109375
    2001-04-18
  • Publication
    EP 1148332
    2005-11-30
  • Granted
    1148332
    2005-11-30
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TitleMethod of inspecting images to detect defects
Granted Patent1148332
Granted Date2005-11-30
Priority Date2000-04-18 US 09/197708P
InventorsKWOK-HUNG, GRANTHAM PANG,
AIAY, KUMAR
CitationEP Published Patent application EP 1148332. European Patent Office (EPO), Escapenet, 2005 [How to Cite?]
AbstractThe present invention relates to a method for automated defect detection in textured materials. The present invention utilizes linear Finite Impulse Response (FIR) filters with optimized energy separation. Specifically, the invention provides a method of inspecting industrial products for defects. The method has steps of: automated design of optimized filters from samples of products, using these optimal filters to filter the acquired images of product under inspection, computing the energy of each pixel in a local region, and finally segmenting the defect by thresholding each pixel. The present invention also relates to a method of inspection of unknown (unsupervised) defects in web materials. In an unsupervised inspection, information from a finite number of optimal filters is combined using a data fusion module.; This module attempts to nullify the false alarm associated with the information arriving from different channels.
DC Field
Value
dc.contributor.inventorKWOK-HUNG, GRANTHAM PANG,
dc.contributor.inventorAIAY, KUMAR
dc.date.accessioned2011-10-19T06:30:03Z
patents.date.application2001-04-18
dc.date.available2011-10-19T06:30:03Z
patents.date.granted2005-11-30
patents.date.priority2000-04-18 US 09/197708P
patents.date.publication2005-11-30
dc.description.abstractThe present invention relates to a method for automated defect detection in textured materials. The present invention utilizes linear Finite Impulse Response (FIR) filters with optimized energy separation. Specifically, the invention provides a method of inspecting industrial products for defects. The method has steps of: automated design of optimized filters from samples of products, using these optimal filters to filter the acquired images of product under inspection, computing the energy of each pixel in a local region, and finally segmenting the defect by thresholding each pixel. The present invention also relates to a method of inspection of unknown (unsupervised) defects in web materials. In an unsupervised inspection, information from a finite number of optimal filters is combined using a data fusion module.; This module attempts to nullify the false alarm associated with the information arriving from different channels.
patents.description.assigneeUNIV HONG KONG [CN]
patents.description.ccEP
patents.description.countryEuropean Patent Office
patents.description.kindB1
patents.identifier.applicationEP20010109375
dc.identifier.citationEP Published Patent application EP 1148332. European Patent Office (EPO), Escapenet, 2005 [How to Cite?]
patents.identifier.granted1148332
patents.identifier.hkutechidEEE-2000-00032
patents.identifier.publicationEP 1148332
dc.identifier.urihttp://hdl.handle.net/10722/142127
patents.relation.familyCN 1335496 (A) 2002-02-13
patents.relation.familyCN 100401043 (C) 2008-07-09
patents.relation.familyDE 60115314 (T2) 2006-08-03
patents.relation.familyHK 1042944 (A1) 2009-01-30
patents.relation.familyUS 2002054293 (A1) 2002-05-09
patents.relation.familyUS 6804381 (B2) 2004-10-12
dc.relation.isreferencedbyAT 507939 (A1) 2010-09-15
dc.relation.isreferencedbyAT 507939 (B1) 2012-02-15
dc.rightsCreative Commons: Attribution 3.0 Hong Kong License For Public Patent Documents
dc.titleMethod of inspecting images to detect defects
dc.typePatent
patents.typePatent_published