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  Patent History
  • Application
    EP20010109375 2001-04-18
  • Publication
    EP 1148332 2005-11-30
  • Granted
    1148332 2005-11-30

published patent: Method of inspecting images to detect defects

TitleMethod of inspecting images to detect defects
Granted Patent1148332
Granted Date2005-11-30
Priority Date2000-04-18 US 09/197708P
Inventors
Issue Date2005
Citation
EP Published Patent application EP 1148332. European Patent Office (EPO), Escapenet, 2005 How to Cite?
AbstractThe present invention relates to a method for automated defect detection in textured materials. The present invention utilizes linear Finite Impulse Response (FIR) filters with optimized energy separation. Specifically, the invention provides a method of inspecting industrial products for defects. The method has steps of: automated design of optimized filters from samples of products, using these optimal filters to filter the acquired images of product under inspection, computing the energy of each pixel in a local region, and finally segmenting the defect by thresholding each pixel. The present invention also relates to a method of inspection of unknown (unsupervised) defects in web materials. In an unsupervised inspection, information from a finite number of optimal filters is combined using a data fusion module.; This module attempts to nullify the false alarm associated with the information arriving from different channels.
Persistent Identifierhttp://hdl.handle.net/10722/142127

 

DC FieldValueLanguage
dc.date.accessioned2011-10-19T06:30:03Z-
dc.date.available2011-10-19T06:30:03Z-
dc.date.issued2005-
dc.identifier.citationEP Published Patent application EP 1148332. European Patent Office (EPO), Escapenet, 2005en_HK
dc.identifier.urihttp://hdl.handle.net/10722/142127-
dc.description.abstractThe present invention relates to a method for automated defect detection in textured materials. The present invention utilizes linear Finite Impulse Response (FIR) filters with optimized energy separation. Specifically, the invention provides a method of inspecting industrial products for defects. The method has steps of: automated design of optimized filters from samples of products, using these optimal filters to filter the acquired images of product under inspection, computing the energy of each pixel in a local region, and finally segmenting the defect by thresholding each pixel. The present invention also relates to a method of inspection of unknown (unsupervised) defects in web materials. In an unsupervised inspection, information from a finite number of optimal filters is combined using a data fusion module.; This module attempts to nullify the false alarm associated with the information arriving from different channels.en_HK
dc.relation.isreferencedbyAT 507939 (A1) 2010-09-15en_HK
dc.relation.isreferencedbyAT 507939 (B1) 2012-02-15en_HK
dc.rightsCreative Commons: Attribution 3.0 Hong Kong License For Public Patent Documents-
dc.titleMethod of inspecting images to detect defectsen_HK
dc.typePatenten_US
dc.identifier.emailPang, Grantham Kwok Hung:gpang@eee.hku.hken_US
dc.identifier.authorityPang, Grantham Kwok Hung=rp00162en_US
dc.description.naturepublished_or_final_version-
dc.contributor.inventorPANG, KWOK-HUNG GRANTHAMen_HK
dc.contributor.inventorKUMAR, AIAYen_HK
patents.identifier.applicationEP20010109375en_HK
patents.identifier.granted1148332en_US
patents.description.assigneeUNIV HONG KONG [CN]en_HK
patents.description.countryEuropean Patent Officeen_HK
patents.date.publication2005-11-30en_HK
patents.date.granted2005-11-30en_US
patents.identifier.hkutechidEEE-2000-00032-3en_US
patents.identifier.hkutechidEEE-2000-00032-4-
patents.identifier.hkutechidEEE-2000-00032-5-
patents.identifier.hkutechidEEE-2000-00032-6-
patents.date.application2001-04-18en_HK
patents.date.priority2000-04-18 US 09/197708Pen_HK
patents.description.ccEPen_HK
patents.identifier.publicationEP 1148332en_HK
patents.relation.familyCN 1335496 (A) 2002-02-13en_HK
patents.relation.familyCN 100401043 (C) 2008-07-09en_HK
patents.relation.familyDE 60115314 (T2) 2006-08-03en_HK
patents.relation.familyHK 1042944 (A1) 2009-01-30en_HK
patents.relation.familyUS 2002054293 (A1) 2002-05-09en_HK
patents.relation.familyUS 6804381 (B2) 2004-10-12en_HK
patents.description.kindB1en_HK
patents.typePatent_publisheden_HK

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