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  Patent History
  • Application
    US 09/837065 2001-04-18
  • Publication
    US 20020054293 2002-05-09
  • Granted
    US 6804381 2004-10-12

granted patent: Method Of And Device For Inspecting Images To Detect Defects

TitleMethod Of And Device For Inspecting Images To Detect Defects
Granted PatentUS 6804381
Granted Date2004-10-12
Priority Date2001-04-18 US 09/837065
2000-04-18 US 09/197708P
Inventors
Issue Date2004
Citation
US Patent 6804381. Washington, DC: US Patent and Trademark Office (USPTO), 2004 How to Cite?
AbstractThe Present Invention Relates To A Method For Automated Defect Detection In Textured Materials. The Present Invention Utilizes Linear Finite Impulse Response (Fir) Filters With Optimized Energy Separation. Specifically, The Invention Provides A Method Of Inspecting Industrial Products For Defects. The Method Has Steps Of: Automated Design Of Optimized Filters From Samples Of Products, Using These Optimal Filters To Filter The Acquired Images Of Product Under Inspection, Computing The Energy Of Each Pixel In A Local Region, And Finally Segmenting The Defect By Thresholding Each Pixel. The Present Invention Also Relates To A Method Of Inspection Of Unknown (Unsupervised) Defects In Web Materials. In An Unsupervised Inspection, Information From A Finite Number Of Optimal Filters Is Combined Using A Data Fusion Module.; This Module Attempts To Nullify The False Alarm Associated With The Information Arriving From Different Channels.
Persistent Identifierhttp://hdl.handle.net/10722/142130
References

 

DC FieldValueLanguage
dc.date.accessioned2011-10-19T06:30:04Z-
dc.date.available2011-10-19T06:30:04Z-
dc.date.issued2004-
dc.identifier.citationUS Patent 6804381. Washington, DC: US Patent and Trademark Office (USPTO), 2004en_HK
dc.identifier.urihttp://hdl.handle.net/10722/142130-
dc.description.abstractThe Present Invention Relates To A Method For Automated Defect Detection In Textured Materials. The Present Invention Utilizes Linear Finite Impulse Response (Fir) Filters With Optimized Energy Separation. Specifically, The Invention Provides A Method Of Inspecting Industrial Products For Defects. The Method Has Steps Of: Automated Design Of Optimized Filters From Samples Of Products, Using These Optimal Filters To Filter The Acquired Images Of Product Under Inspection, Computing The Energy Of Each Pixel In A Local Region, And Finally Segmenting The Defect By Thresholding Each Pixel. The Present Invention Also Relates To A Method Of Inspection Of Unknown (Unsupervised) Defects In Web Materials. In An Unsupervised Inspection, Information From A Finite Number Of Optimal Filters Is Combined Using A Data Fusion Module.; This Module Attempts To Nullify The False Alarm Associated With The Information Arriving From Different Channels.en_HK
dc.relation.isreferencedbyUS 2009022391 (A1) 2009-01-22en_HK
dc.relation.isreferencedbyUS 8000501 (B2) 2011-08-16en_HK
dc.relation.isreferencedbyUS 2004245485 (A1) 2004-12-09en_HK
dc.relation.isreferencedbyUS 7601978 (B2) 2009-10-13en_HK
dc.relation.isreferencedbyUS 2003197857 (A1) 2003-10-23en_HK
dc.relation.isreferencedbyUS 7032208 (B2) 2006-04-18en_HK
dc.rightsCreative Commons: Attribution 3.0 Hong Kong License For Public Patent Documents-
dc.titleMethod Of And Device For Inspecting Images To Detect Defectsen_HK
dc.typePatenten_US
dc.identifier.emailPang, Grantham Kwok Hung:gpang@eee.hku.hken_US
dc.identifier.authorityPang, Grantham Kwok Hung=rp00162en_US
dc.description.naturepublished_or_final_version-
dc.contributor.inventorPang, Grantham Kwok Hungen_US
dc.contributor.inventorKumar, Ajayen_US
patents.identifier.applicationUS 09/837065en_HK
patents.identifier.grantedUS 6804381en_HK
patents.description.assigneeUniv Hong Kong [Cn]en_HK
patents.description.countryUnited States of Americaen_HK
patents.date.publication2002-05-09en_HK
patents.date.granted2004-10-12en_HK
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patents.date.application2001-04-18en_HK
patents.date.priority2001-04-18 US 09/837065en_HK
patents.date.priority2000-04-18 US 09/197708Pen_HK
patents.description.ccUSen_HK
patents.identifier.publicationUS 20020054293en_HK
patents.relation.familyCN 1335496 (A) 2002-02-13en_HK
patents.relation.familyCN 100401043 (C) 2008-07-09en_HK
patents.relation.familyDE 60115314 (T2) 2006-08-03en_HK
patents.relation.familyEP 1148332 (A2) 2001-10-24en_HK
patents.relation.familyHK 1042944 (A1) 2009-01-30en_HK
patents.relation.familyUS 2002054293 (A1) 2002-05-09en_HK
patents.relation.familyUS 6804381 (B2) 2004-10-12en_HK
patents.description.kindB2en_HK
patents.typePatent_granteden_HK

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