Showing results 4 to 6 of 6
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Title | Author(s) | Issue Date | |
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Influence of Si-nanocrystal distribution in the oxide on the charging behavior of MOS structures Journal:IEEE Transactions on Electron Devices | 2006 | ||
Influence of silicon-nanocrystal distribution in SiO2 matrix on charge injection and charge decay Journal:Applied Physics Letters | 2005 | ||
Si ion-induced instability in flatband Voltage of Si/sup +/-implanted gate oxides Journal:IEEE Transactions on Electron Devices | 2006 |