Showing results 14 to 16 of 16
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Title | Author(s) | Issue Date | |
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The influence of ion implantation on the off-state leakage characteristics of n-MOSFETs with ultrathin oxide, nitrided-oxide and re-oxidized nitrided-oxide gate dielectrics Proceeding/Conference:International Conference on VLSI and CAD Proceedings | 1993 | ||
Trap-assisted conduction in nitrided-oxide and re-oxidized nitrided-oxide n-channel metal-oxide-semiconductor field-effect transistors Journal:Journal of Applied Physics | 1993 | ||
1990 |