Showing results 72 to 91 of 190
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Title | Author(s) | Issue Date | |
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Effective moving cast shadow detection for monocular color image sequences Proceeding/Conference:International Conference on Image Analysis and Processing Proceedings | 2001 | ||
Effective moving cast shadow detection for monocular color traffic image sequences Journal:Optical Engineering | 2002 | ||
Elevator scheduling system using blackboard architecture Journal:IEE Proceedings D: Control Theory and Applications | 1991 | ||
Ellipsoidal decision regions for motif-based patterned fabric defect detection Journal:Pattern Recognition | 2010 | ||
Erratum: Solder paste inspection using region-based defect detection (International Journal of Advanced Manufacturing Technology DOI 10.1007/s00170-008-1639-6) Journal:International Journal of Advanced Manufacturing Technology | 2009 | ||
Evaluation of a low cost solid-state accelerometer as a distance measuring sensor for vehicle positioning system Proceeding/Conference:IEEE Conference on Intelligent Transportation Systems, Proceedings, ITSC | 1999 | ||
Evaluation of a low-cost MEMS accelerometer for distance measurement Journal:Journal of Intelligent and Robotic Systems: Theory and Applications | 2001 | ||
Evolutionary approach on connectivity-based sensor network localization Journal:Applied Soft Computing | 2014 | ||
Experimental and Simulation tools for Nanostructures Proceeding/Conference:Proc. of First Asia International Symposium on Mechatronics (AISM 2004) | 2004 | ||
An expert adaptive control scheme in an intelligent process control system Proceeding/Conference:Proceedings of the 1991 IEEE International Symposium on Intelligent Control | 1991 | ||
Expert system development facility in a MATLAB-derived control environment Proceeding/Conference:IEEE Control Systems Society Workshop on Computer-Aided Control System Design, CACSD 1989 | 1989 | ||
EXPERT SYSTEM FOR CAD OF MULTIVARIABLE CONTROL SYSTEMS USING A SYSTEMATIC DESIGN APPROACH. Proceeding/Conference:Proceedings of the American Control Conference | 1987 | ||
EXPERT SYSTEM FOR COMPUTER-AIDED LINEAR MULTIVARIABLE CONTROL SYSTEM DESIGN. Proceeding/Conference:IEEE Control Systems Society Third Symposium on Computer-Aided Control System Design (CACSD'86) Proceedings | 1986 | ||
Fabric defect classification using wavelet frames and minimum classification error training Proceeding/Conference:Conference Record of the 2002 IEEE Industry Applications Conference. 37th IAS Annual Meeting | 2002 | ||
Fabric defect classification using wavelet frames and minimum classification error-based neural network Proceeding/Conference:IEEE Conference on Mechatronics and Machine Vision in Practice | 2002 | ||
Fabric defect detection by Fourier analysis Journal:IEEE Transactions on Industry Applications | 2000 | ||
Fabric defect detection by Fourier analysis Proceeding/Conference:Industry Applications Society. IEEE - IAS Annual Meeting Conference Record | 1999 | ||
Fabric Defect Detection by Matched Filters Proceeding/Conference:Proc. of First Asia International Symposium on Mechatronics (AISM 2004) | 2004 | ||
Fabric defect detection using adaptive wavelet Proceeding/Conference:ICASSP, IEEE International Conference on Acoustics, Speech and Signal Processing - Proceedings | 2001 | ||
Fabric defect segmentation using multichannel blob detectors Journal:Optical Engineering | 2000 |