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Conference Paper: Fabric defect classification using wavelet frames and minimum classification error training
Title | Fabric defect classification using wavelet frames and minimum classification error training |
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Authors | |
Keywords | Defect classification Fabric inspection Minimum classification error Wavelet frames |
Issue Date | 2002 |
Publisher | IEEE. |
Citation | 37th IAS Annual Meeting and World Conference on Industrial applications of Electrical Energy, Pittsburgh, PA, 13-18 October 2002. In Conference Record of the 2002 IEEE Industry Applications Conference. 37th IAS Annual Meeting, 2002, v. 1, p. 290-296 How to Cite? |
Abstract | This paper proposes a new method for fabric defect classification by incorporating the design of a wavelet frames based feature extractor with the design of an Euclidean distance based classifier. Channel variances at the outputs of the wavelet frame decomposition are used to characterize each nonoverlapping window of the fabric image. A feature extractor using linear transformation matrix is further employed to extract the classification-oriented features. With an Euclidean distance based classifier, each nonoverlapping window of the fabric image is then assigned to its corresponding category. Minimization of the classification error is achieved by incorporating the design of the feature extractor with the design of the classifier based on Minimum Classification Error (MCE) training method. The proposed method has been evaluated on the classification of 329 defect samples containing nine classes of fabric defects, and 328 nondefect samples, where 93.1% classification accuracy has been achieved. |
Persistent Identifier | http://hdl.handle.net/10722/54049 |
ISSN | 2023 SCImago Journal Rankings: 0.422 |
References |
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Yang, X | en_HK |
dc.contributor.author | Pang, G | en_HK |
dc.contributor.author | Yung, N | en_HK |
dc.date.accessioned | 2009-04-03T07:35:26Z | - |
dc.date.available | 2009-04-03T07:35:26Z | - |
dc.date.issued | 2002 | en_HK |
dc.identifier.citation | 37th IAS Annual Meeting and World Conference on Industrial applications of Electrical Energy, Pittsburgh, PA, 13-18 October 2002. In Conference Record of the 2002 IEEE Industry Applications Conference. 37th IAS Annual Meeting, 2002, v. 1, p. 290-296 | en_HK |
dc.identifier.issn | 0197-2618 | en_HK |
dc.identifier.uri | http://hdl.handle.net/10722/54049 | - |
dc.description.abstract | This paper proposes a new method for fabric defect classification by incorporating the design of a wavelet frames based feature extractor with the design of an Euclidean distance based classifier. Channel variances at the outputs of the wavelet frame decomposition are used to characterize each nonoverlapping window of the fabric image. A feature extractor using linear transformation matrix is further employed to extract the classification-oriented features. With an Euclidean distance based classifier, each nonoverlapping window of the fabric image is then assigned to its corresponding category. Minimization of the classification error is achieved by incorporating the design of the feature extractor with the design of the classifier based on Minimum Classification Error (MCE) training method. The proposed method has been evaluated on the classification of 329 defect samples containing nine classes of fabric defects, and 328 nondefect samples, where 93.1% classification accuracy has been achieved. | en_HK |
dc.language | eng | en_HK |
dc.publisher | IEEE. | en_HK |
dc.relation.ispartof | Conference Record of the 2002 IEEE Industry Applications Conference. 37th IAS Annual Meeting | en_HK |
dc.rights | ©2002 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE. | - |
dc.subject | Defect classification | en_HK |
dc.subject | Fabric inspection | en_HK |
dc.subject | Minimum classification error | en_HK |
dc.subject | Wavelet frames | en_HK |
dc.title | Fabric defect classification using wavelet frames and minimum classification error training | en_HK |
dc.type | Conference_Paper | en_HK |
dc.identifier.email | Pang, G:gpang@eee.hku.hk | en_HK |
dc.identifier.email | Yung, N:nyung@eee.hku.hk | en_HK |
dc.identifier.authority | Pang, G=rp00162 | en_HK |
dc.identifier.authority | Yung, N=rp00226 | en_HK |
dc.description.nature | published_or_final_version | en_HK |
dc.identifier.doi | 10.1109/IAS.2002.1044102 | - |
dc.identifier.scopus | eid_2-s2.0-0036444444 | en_HK |
dc.identifier.hkuros | 81219 | - |
dc.relation.references | http://www.scopus.com/mlt/select.url?eid=2-s2.0-0036444444&selection=ref&src=s&origin=recordpage | en_HK |
dc.identifier.volume | 1 | en_HK |
dc.identifier.spage | 290 | en_HK |
dc.identifier.epage | 296 | en_HK |
dc.publisher.place | United States | en_HK |
dc.identifier.scopusauthorid | Yang, X=7406505132 | en_HK |
dc.identifier.scopusauthorid | Pang, G=7103393283 | en_HK |
dc.identifier.scopusauthorid | Yung, N=7003473369 | en_HK |
dc.identifier.issnl | 0197-2618 | - |