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Conference Paper: Fabric defect detection using adaptive wavelet

TitleFabric defect detection using adaptive wavelet
Authors
KeywordsEngineering
Electrical engineering
Issue Date2001
PublisherIEEE.
Citation
Icassp, Ieee International Conference On Acoustics, Speech And Signal Processing - Proceedings, 2001, v. 6, p. 3697-3700 How to Cite?
AbstractThis paper studies the adaptive wavelet design for fabric defect detection. In order to achieve translation invariance and more flexible design, the wavelet design focused on nonsubsampled wavelet transform. We design the wavelet filters under the constraints that the analysis filters are power complementary, and the wavelet has only one vanishing moment, which corresponds to a multiscale edge detector. Based on lattice structure factorization, the design of power complementary filter turn out to be unconstrained optimization of lattice coefficients. Adaptive wavelets are designed for five kinds of fabric defects in the experiments. Comparing the proposed method with adaptive wavelet design for defect detection based on orthogonal wavelet transform, our design largely improve the ratio of wavelet transform energy between the defect area and the background, and achieve a robust and accurate detection of fabric defects.
Persistent Identifierhttp://hdl.handle.net/10722/46236
ISSN
References

 

DC FieldValueLanguage
dc.contributor.authorZhi, YXen_HK
dc.contributor.authorPang, GKHen_HK
dc.contributor.authorYung, NHCen_HK
dc.date.accessioned2007-10-30T06:45:24Z-
dc.date.available2007-10-30T06:45:24Z-
dc.date.issued2001en_HK
dc.identifier.citationIcassp, Ieee International Conference On Acoustics, Speech And Signal Processing - Proceedings, 2001, v. 6, p. 3697-3700en_HK
dc.identifier.issn0736-7791en_HK
dc.identifier.urihttp://hdl.handle.net/10722/46236-
dc.description.abstractThis paper studies the adaptive wavelet design for fabric defect detection. In order to achieve translation invariance and more flexible design, the wavelet design focused on nonsubsampled wavelet transform. We design the wavelet filters under the constraints that the analysis filters are power complementary, and the wavelet has only one vanishing moment, which corresponds to a multiscale edge detector. Based on lattice structure factorization, the design of power complementary filter turn out to be unconstrained optimization of lattice coefficients. Adaptive wavelets are designed for five kinds of fabric defects in the experiments. Comparing the proposed method with adaptive wavelet design for defect detection based on orthogonal wavelet transform, our design largely improve the ratio of wavelet transform energy between the defect area and the background, and achieve a robust and accurate detection of fabric defects.en_HK
dc.format.extent413387 bytes-
dc.format.extent4353 bytes-
dc.format.extent10863 bytes-
dc.format.mimetypeapplication/pdf-
dc.format.mimetypetext/plain-
dc.format.mimetypetext/plain-
dc.languageengen_HK
dc.publisherIEEE.en_HK
dc.relation.ispartofICASSP, IEEE International Conference on Acoustics, Speech and Signal Processing - Proceedingsen_HK
dc.rightsCreative Commons: Attribution 3.0 Hong Kong License-
dc.rights©2001 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.en_HK
dc.subjectEngineeringen_HK
dc.subjectElectrical engineeringen_HK
dc.titleFabric defect detection using adaptive waveleten_HK
dc.typeConference_Paperen_HK
dc.identifier.openurlhttp://library.hku.hk:4550/resserv?sid=HKU:IR&issn=1520-6149&volume=6&spage=3697&epage=3700&date=2001&atitle=Fabric+defect+detection+using+adaptive+waveleten_HK
dc.identifier.emailPang, GKH:gpang@eee.hku.hken_HK
dc.identifier.emailYung, NHC:nyung@eee.hku.hken_HK
dc.identifier.authorityPang, GKH=rp00162en_HK
dc.identifier.authorityYung, NHC=rp00226en_HK
dc.description.naturepublished_or_final_versionen_HK
dc.identifier.doi10.1109/ICASSP.2001.940645en_HK
dc.identifier.scopuseid_2-s2.0-0034854137en_HK
dc.identifier.hkuros58879-
dc.relation.referenceshttp://www.scopus.com/mlt/select.url?eid=2-s2.0-0034854137&selection=ref&src=s&origin=recordpageen_HK
dc.identifier.volume6en_HK
dc.identifier.spage3697en_HK
dc.identifier.epage3700en_HK
dc.identifier.scopusauthoridZhi, YX=7004142885en_HK
dc.identifier.scopusauthoridPang, GKH=7103393283en_HK
dc.identifier.scopusauthoridYung, NHC=7003473369en_HK

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