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Conference Paper: Local affine invariant based line matching between two images

TitleLocal affine invariant based line matching between two images
Authors
Chan, CHHung, YSLeung, CH
Issue Date2005
Citation
The 3rd Regional Inter-University Postgraduate Electrical and Electronic Engineering Conference (RIUPEEEC 2005), Hong Kong, 14 - 15 July 2005 How to Cite?
Persistent Identifierhttp://hdl.handle.net/10722/98961

 

DC FieldValueLanguage
dc.contributor.authorChan, CHen_HK
dc.contributor.authorHung, YSen_HK
dc.contributor.authorLeung, CHen_HK
dc.date.accessioned2010-09-25T18:09:52Z-
dc.date.available2010-09-25T18:09:52Z-
dc.date.issued2005en_HK
dc.identifier.citationThe 3rd Regional Inter-University Postgraduate Electrical and Electronic Engineering Conference (RIUPEEEC 2005), Hong Kong, 14 - 15 July 2005-
dc.identifier.urihttp://hdl.handle.net/10722/98961-
dc.languageengen_HK
dc.relation.ispartofThe Regional Inter-University Postgraduate Electrical and Electronic Engineering Conference, RIUPEEEC 2005en_HK
dc.titleLocal affine invariant based line matching between two imagesen_HK
dc.typeConference_Paperen_HK
dc.identifier.emailHung, YS: yshung@eee.hku.hken_HK
dc.identifier.emailLeung, CH: chleung@eee.hku.hken_HK
dc.identifier.authorityHung, YS=rp00220en_HK
dc.identifier.authorityLeung, CH=rp00146en_HK
dc.identifier.hkuros117221en_HK

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