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Browsing "Department of Electrical & Electronic Engineering" by Author zeng, x
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Showing results 1 to 16 of 16
Title
Author(s)
Issue Date
A novel technique of N2O-treatment on NH3-nitrided oxide for fabricating gate oxide in nMOSFET's
Proceeding/Conference:
International Conference on VLSI and CAD Proceedings
Zeng, X
Lai, PT
Ng, WT
1995
AC hot-carrier-induced degradation in NMOSFET's with N 2O-based gate dielectrics
Journal:
IEEE Electron Device Letters
Zeng, X
Lai, PT
Ng, WT
1997
Back-action of dielectric microparticles mediated by photonic nanojet
Proceeding/Conference:
14th Pacific Rim Conference on Lasers and Electro-Optics (CLEO PR 2020)
Ren, YX
Zeng, X
Zhou, L
Kong, C
Qiu, C
Tsia, KKM
Wong, KKY
2020
Charge trapping properties of N2O-treated NH3-nitrided oxides under high-field stress
Proceeding/Conference:
IEEE Region International Conference on Microelectronics and VLSI Proceedings
Zeng, X
Lai, PT
Ng, WT
1995
Effects of backsurface Ar+ bombardment on n-MOSFET's with nitride gate oxides
Proceeding/Conference:
IEEE International Conference on Semiconductor Electronics, Proceedings, ICSE
Lai, PT
Zeng, X
Li, GQ
Ng, WT
1997
The effects of duty cycle and voltage swing of gate pulse on the AC-stress-induced degradation of nMOSFETs with N2O gate oxides
Journal:
Microelectronics Reliability
Zeng, X
Lai, PT
Xu, JP
1998
Encrypted wide-field two-photon microscopy with single-pixel detection and compressed sensing
Journal:
Applied Physics Express
Ren, YX
Kong, C
He, H
Zeng, X
Tsia, KKT
Wong, KKY
2020
Enhance The Backaction Force Mediated By Photonic Nanojet With A Broadband Supercontinuum Source
Proceeding/Conference:
Optoelectronics Global Conference (OGC) 2020
Ren, YX
Zhou, Y
Mao, HD
Zhou, LM
Wang, S
Kong, C
Zeng, X
Qiu, C
Tsia, KKM
Wong, KKY
2020
Influence of backsurface argon bombardment on SiO2-Si interface characteristics
Journal:
Applied Physics Letters
Lai, PT
Huang, MQ
Zeng, X
Zeng, SH
Li, GQ
1996
Interface-state-induced degradation of GIDL current in n-MOSFETsunder hot-carrier stress
Proceeding/Conference:
Proceedings of the IEEE Hong Kong Electron Devices Meeting
Lai, PT
Xu, JP
Zeng, X
Liu, BY
1996
New observation and improvement in GIDL current of N-MOSFET's with various kinds of gate oxides under hot-carrier stress
Proceeding/Conference:
IEEE International Conference on Semiconductor Electronics, Proceedings, ICSE
Lai, PT
Jingping, Xu
Zeng, X
Cheng, YC
1997
New observation and improvement in GIDL of n-MOSFETs with various kinds of N2O-based gate oxides under hot-carrier stress
Journal:
Solid-State Electronics
Lai, PT
Xu, J
Zeng, X
Cheng, YC
1996
A novel technique of N2O-treatment on NH3-nitrided oxide as gate dielectric for nMOS transistors
Journal:
IEEE Transactions on Electron Devices
Zeng, X
Lai, PT
Ng, WT
1996
Off-state gate leakage current in N-channel MOSFETs with gate dielectrics prepared by different techniques
Zeng, X
Lai, PT
Ng, WT
1995
Off-state leakage current in N-channel MOSFETs with gate dielectrics prepared by different techniques
Proceeding/Conference:
Microelectronic Engineering
Zeng, X
Lai, PT
Ng, WT
1995
Photonic Nanojet Mediated Backaction of Dielectric Microparticles
Journal:
ACS Photonics
Ren, YX
Zeng, X
Zhou, LM
Kong, C
Mao, H
Qiu, CW
Tsia, KK
Wong, KKY
2020
