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Title | Author(s) | Issue Date | |
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Redundancy and Analog Slicing for Precise In-Memory Machine Learning—Part II: Applications and Benchmark Journal:IEEE Transactions on Electron Devices | 2021 |
Title | Author(s) | Issue Date | |
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Redundancy and Analog Slicing for Precise In-Memory Machine Learning—Part II: Applications and Benchmark Journal:IEEE Transactions on Electron Devices | 2021 |