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Browsing "Department of Electrical & Electronic Engineering" by Author kawanago, t.
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Title
Author(s)
Issue Date
Electronic trap characterization of the Sc<inf>2</inf>O<inf>3</inf>La <inf>2</inf>O<inf>3</inf> high- κ gate stack by scanning tunneling microscopy
Journal:
Applied Physics Letters
Ong, Y. C.
Ang, D. S.
Pey, K. L.
Wang, Z. R.
O'Shea, S. J.
Tung, C. H.
Kawanago, T.
Kakushima, K.
Iwai, H.
2008