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Conference Paper: Defect tolerant in-memory analog computing with CMOS-integrated nanoscale crossbars: Invited

TitleDefect tolerant in-memory analog computing with CMOS-integrated nanoscale crossbars: Invited
Authors
JIANG, MMAO, RStrachan, JPLi, C
Issue Date2021
PublisherIEEE.
Citation
2021 28th IEEE International Conference on Electronics, Circuits, and Systems (ICECS), p. 1-4 How to Cite?
DOI: http://dx.doi.org/10.1109/ICECS53924.2021.9665649
Persistent Identifierhttp://hdl.handle.net/10722/322601
ISI Accession Number ID
WOS:000784162400158

 

DC FieldValueLanguage
dc.contributor.authorJIANG, M-
dc.contributor.authorMAO, R-
dc.contributor.authorStrachan, JP-
dc.contributor.authorLi, C-
dc.date.accessioned2022-11-14T08:27:49Z-
dc.date.available2022-11-14T08:27:49Z-
dc.date.issued2021-
dc.identifier.citation2021 28th IEEE International Conference on Electronics, Circuits, and Systems (ICECS), p. 1-4-
dc.identifier.urihttp://hdl.handle.net/10722/322601-
dc.languageeng-
dc.publisherIEEE. -
dc.relation.ispartof2021 28th IEEE International Conference on Electronics, Circuits, and Systems (ICECS)-
dc.rights2021 28th IEEE International Conference on Electronics, Circuits, and Systems (ICECS). Copyright © IEEE.-
dc.rights©20xx IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.-
dc.titleDefect tolerant in-memory analog computing with CMOS-integrated nanoscale crossbars: Invited-
dc.typeConference_Paper-
dc.identifier.emailLi, C: canl@hku.hk-
dc.identifier.authorityLi, C=rp02706-
dc.identifier.doi10.1109/ICECS53924.2021.9665649-
dc.identifier.hkuros341834-
dc.identifier.spage1-
dc.identifier.epage4-
dc.identifier.isiWOS:000784162400158-

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