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- Publisher Website: 10.1109/IRPS.2010.5488697
- Scopus: eid_2-s2.0-77957911084
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Conference Paper: Bias temperature instability of binary oxide based reram
Title | Bias temperature instability of binary oxide based reram |
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Authors | |
Keywords | Resistance random access memory Bias temperature instability |
Issue Date | 2010 |
Citation | IEEE International Reliability Physics Symposium Proceedings, 2010, p. 964-965 How to Cite? |
Abstract | Bias temperature instability of TiN/HfOx/Pt resistive random access memory (ReRAM) device is investigated in this work for the first time. As temperature increases (up to 100oC in this work), it is observed that: 1) leakage current at high resistance state (HRS) increases, which can be explained by the higher density of traps inside dielectrics (related to trap-assistant tunneling), leading to a lower On/Off ratio; 2) set and reset voltages decrease, which may be attributed to the higher oxygen ion mobility, in addition to the reduced potential barrier to create / recover oxygen ions (or oxygen vacancies); 3) electrical stress plays a negligible role as compared to the temperature impact on the ReRAM degradation; and 4) multi-level switching behavior exhibited at room temperature might not be retained. © 2010 IEEE. |
Persistent Identifier | http://hdl.handle.net/10722/286853 |
ISSN | 2020 SCImago Journal Rankings: 0.380 |
ISI Accession Number ID |
DC Field | Value | Language |
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dc.contributor.author | Fang, Z. | - |
dc.contributor.author | Yu, H. Y. | - |
dc.contributor.author | Liu, W. J. | - |
dc.contributor.author | Pey, K. L. | - |
dc.contributor.author | Li, X. | - |
dc.contributor.author | Wu, L. | - |
dc.contributor.author | Wang, Z. R. | - |
dc.contributor.author | Lo, Patrick G.Q. | - |
dc.contributor.author | Gao, B. | - |
dc.contributor.author | Kang, J. F. | - |
dc.date.accessioned | 2020-09-07T11:45:51Z | - |
dc.date.available | 2020-09-07T11:45:51Z | - |
dc.date.issued | 2010 | - |
dc.identifier.citation | IEEE International Reliability Physics Symposium Proceedings, 2010, p. 964-965 | - |
dc.identifier.issn | 1541-7026 | - |
dc.identifier.uri | http://hdl.handle.net/10722/286853 | - |
dc.description.abstract | Bias temperature instability of TiN/HfOx/Pt resistive random access memory (ReRAM) device is investigated in this work for the first time. As temperature increases (up to 100oC in this work), it is observed that: 1) leakage current at high resistance state (HRS) increases, which can be explained by the higher density of traps inside dielectrics (related to trap-assistant tunneling), leading to a lower On/Off ratio; 2) set and reset voltages decrease, which may be attributed to the higher oxygen ion mobility, in addition to the reduced potential barrier to create / recover oxygen ions (or oxygen vacancies); 3) electrical stress plays a negligible role as compared to the temperature impact on the ReRAM degradation; and 4) multi-level switching behavior exhibited at room temperature might not be retained. © 2010 IEEE. | - |
dc.language | eng | - |
dc.relation.ispartof | IEEE International Reliability Physics Symposium Proceedings | - |
dc.subject | Resistance random access memory | - |
dc.subject | Bias temperature instability | - |
dc.title | Bias temperature instability of binary oxide based reram | - |
dc.type | Conference_Paper | - |
dc.description.nature | link_to_subscribed_fulltext | - |
dc.identifier.doi | 10.1109/IRPS.2010.5488697 | - |
dc.identifier.scopus | eid_2-s2.0-77957911084 | - |
dc.identifier.spage | 964 | - |
dc.identifier.epage | 965 | - |
dc.identifier.isi | WOS:000287515600165 | - |
dc.identifier.issnl | 1541-7026 | - |