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- Publisher Website: 10.1103/PhysRevB.100.205119
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Article: Impurity-induced resonant states in topological nodal-line semimetals
Title | Impurity-induced resonant states in topological nodal-line semimetals |
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Authors | |
Keywords | SCATTERING |
Issue Date | 2019 |
Publisher | American Physical Society. The Journal's web site is located at http://journals.aps.org/prb/ |
Citation | Physical Review B: covering condensed matter and materials physics, 2019, v. 100 n. 20, p. article no. 205119 How to Cite? |
Abstract | Nodal-line semimetals are characterized by a kind of topologically nontrivial bulk-band crossing, giving rise to almost flat surface states. Notably, direct evidence of the surface states is still awaited. Here we theoretically study impurity effects in topological nodal-line semimetals based on the T-matrix method. It is found that some low energy states may be induced near the impurity site for a bulk impurity, while the visible resonant impurity state can only exist for certain impurity strength. For a surface impurity, a robust resonant impurity state exists in a wide parametric range of impurity strength. Such robust resonant state stems from the topologically protected weak dispersive surface states, which can be probed by scanning tunneling microscopy, providing a clear signature of the topological surface states in the nodal-line semimetals. |
Persistent Identifier | http://hdl.handle.net/10722/279997 |
ISSN | 2023 Impact Factor: 3.2 2023 SCImago Journal Rankings: 1.345 |
ISI Accession Number ID |
DC Field | Value | Language |
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dc.contributor.author | Zhou, T | - |
dc.contributor.author | Chen, W | - |
dc.contributor.author | Gao, Y | - |
dc.contributor.author | Wang, ZD | - |
dc.date.accessioned | 2019-12-23T08:24:46Z | - |
dc.date.available | 2019-12-23T08:24:46Z | - |
dc.date.issued | 2019 | - |
dc.identifier.citation | Physical Review B: covering condensed matter and materials physics, 2019, v. 100 n. 20, p. article no. 205119 | - |
dc.identifier.issn | 2469-9950 | - |
dc.identifier.uri | http://hdl.handle.net/10722/279997 | - |
dc.description.abstract | Nodal-line semimetals are characterized by a kind of topologically nontrivial bulk-band crossing, giving rise to almost flat surface states. Notably, direct evidence of the surface states is still awaited. Here we theoretically study impurity effects in topological nodal-line semimetals based on the T-matrix method. It is found that some low energy states may be induced near the impurity site for a bulk impurity, while the visible resonant impurity state can only exist for certain impurity strength. For a surface impurity, a robust resonant impurity state exists in a wide parametric range of impurity strength. Such robust resonant state stems from the topologically protected weak dispersive surface states, which can be probed by scanning tunneling microscopy, providing a clear signature of the topological surface states in the nodal-line semimetals. | - |
dc.language | eng | - |
dc.publisher | American Physical Society. The Journal's web site is located at http://journals.aps.org/prb/ | - |
dc.relation.ispartof | Physical Review B: covering condensed matter and materials physics | - |
dc.rights | Physical Review B: covering condensed matter and materials physics. Copyright © American Physical Society. | - |
dc.rights | Copyright [2019] by The American Physical Society. This article is available online at [http://dx.doi.org/10.1103/PhysRevB.100.205119]. | - |
dc.subject | SCATTERING | - |
dc.title | Impurity-induced resonant states in topological nodal-line semimetals | - |
dc.type | Article | - |
dc.identifier.email | Wang, ZD: zwang@hku.hk | - |
dc.identifier.authority | Wang, ZD=rp00802 | - |
dc.description.nature | published_or_final_version | - |
dc.identifier.doi | 10.1103/PhysRevB.100.205119 | - |
dc.identifier.scopus | eid_2-s2.0-85075282310 | - |
dc.identifier.hkuros | 308725 | - |
dc.identifier.volume | 100 | - |
dc.identifier.issue | 20 | - |
dc.identifier.spage | article no. 205119 | - |
dc.identifier.epage | article no. 205119 | - |
dc.identifier.isi | WOS:000495967500004 | - |
dc.publisher.place | United States | - |
dc.identifier.issnl | 2469-9950 | - |