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Conference Paper: Radiation compatible ports and loads for the PEEC method

TitleRadiation compatible ports and loads for the PEEC method
Authors
Cao, YJiang, LRuehli, AEFan, JDrewniak, JL
Issue Date2016
PublisherIEEE. The Journal's web site is located at http://ieeexplore.ieee.org/xpl/conhome.jsp?punumber=1000236
Citation
Proceedings of 2016 IEEE 25th Conference on Electrical Performance Of Electronic Packaging And Systems (EPEPS), San Diego, CA, USA, 23-26 October 2016, p. 107-110 How to Cite?
DOI: http://dx.doi.org/10.1109/EPEPS.2016.7835429
Persistent Identifierhttp://hdl.handle.net/10722/247813

 

DC FieldValueLanguage
dc.contributor.authorCao, Y-
dc.contributor.authorJiang, L-
dc.contributor.authorRuehli, AE-
dc.contributor.authorFan, J-
dc.contributor.authorDrewniak, JL-
dc.date.accessioned2017-10-18T08:33:03Z-
dc.date.available2017-10-18T08:33:03Z-
dc.date.issued2016-
dc.identifier.citationProceedings of 2016 IEEE 25th Conference on Electrical Performance Of Electronic Packaging And Systems (EPEPS), San Diego, CA, USA, 23-26 October 2016, p. 107-110-
dc.identifier.urihttp://hdl.handle.net/10722/247813-
dc.languageeng-
dc.publisherIEEE. The Journal's web site is located at http://ieeexplore.ieee.org/xpl/conhome.jsp?punumber=1000236-
dc.relation.ispartofConference on Electrical Performance of Electronic Packaging and Systems (EPEPS) proceedings-
dc.rightsConference on Electrical Performance of Electronic Packaging and Systems (EPEPS) proceedings. Copyright © IEEE.-
dc.rights©2016 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.-
dc.titleRadiation compatible ports and loads for the PEEC method-
dc.typeConference_Paper-
dc.identifier.emailJiang, L: jianglj@hku.hk-
dc.identifier.authorityJiang, L=rp01338-
dc.identifier.doi10.1109/EPEPS.2016.7835429-
dc.identifier.scopuseid_2-s2.0-85015174779-
dc.identifier.hkuros280787-
dc.identifier.spage107-
dc.identifier.epage110-
dc.publisher.placeUnited States-

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