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Conference Paper: Optical wavelength-swept source at 2.0 μm and its application for ultrafast microscopy

TitleOptical wavelength-swept source at 2.0 μm and its application for ultrafast microscopy
Authors
Tan, SWei, XYang, LLi, CChen, NWong, KKY
Issue Date2017
PublisherIEEE. The Journal's web site is located at http://ieeexplore.ieee.org/xpl/conhome.jsp?punumber=1800377
Citation
2017 Conference on Lasers and Electro-Optics (CLEO), San Jose, CA, USA, 14-19 May 2017, paper no. JW2A.65 How to Cite?
DOI: http://dx.doi.org/10.1364/CLEO_AT.2017.JW2A.65
AbstractWe report an optical wavelength-swept source at 2 μm at a sweeping rate of ~18.926 MHz over 30-nm sweeping range based on a chirped fiber Bragg grating. Application in time-stretch microscopy is subsequently demonstrated. © 2017 OSA
DescriptionWednesday Posters Session (JW2A): Paper no. JW2A.65
Persistent Identifierhttp://hdl.handle.net/10722/246313
ISBN
978-1-9435-8027-9

 

DC FieldValueLanguage
dc.contributor.authorTan, S-
dc.contributor.authorWei, X-
dc.contributor.authorYang, L-
dc.contributor.authorLi, C-
dc.contributor.authorChen, N-
dc.contributor.authorWong, KKY-
dc.date.accessioned2017-09-18T02:26:18Z-
dc.date.available2017-09-18T02:26:18Z-
dc.date.issued2017-
dc.identifier.citation2017 Conference on Lasers and Electro-Optics (CLEO), San Jose, CA, USA, 14-19 May 2017, paper no. JW2A.65-
dc.identifier.isbn978-1-9435-8027-9-
dc.identifier.urihttp://hdl.handle.net/10722/246313-
dc.descriptionWednesday Posters Session (JW2A): Paper no. JW2A.65-
dc.description.abstractWe report an optical wavelength-swept source at 2 μm at a sweeping rate of ~18.926 MHz over 30-nm sweeping range based on a chirped fiber Bragg grating. Application in time-stretch microscopy is subsequently demonstrated. © 2017 OSA-
dc.languageeng-
dc.publisherIEEE. The Journal's web site is located at http://ieeexplore.ieee.org/xpl/conhome.jsp?punumber=1800377-
dc.relation.ispartofConference on Lasers and Electro-Optics Proceedings-
dc.rightsConference on Lasers and Electro-Optics Proceedings. Copyright © IEEE.-
dc.rights©2017 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.-
dc.titleOptical wavelength-swept source at 2.0 μm and its application for ultrafast microscopy-
dc.typeConference_Paper-
dc.identifier.emailWong, KKY: kywong@eee.hku.hk-
dc.identifier.authorityWong, KKY=rp00189-
dc.identifier.doi10.1364/CLEO_AT.2017.JW2A.65-
dc.identifier.scopuseid_2-s2.0-85020459220-
dc.identifier.hkuros278329-
dc.identifier.spageJW2A.65-
dc.identifier.epageJW2A.65-
dc.publisher.placeUnited States-

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