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Conference Paper: Emission characteristics of light-emitting diodes by confocal microscopy

TitleEmission characteristics of light-emitting diodes by confocal microscopy
Authors
KeywordsConfocal microscopy
Light-emitting diodes
Issue Date2016
PublisherSPIE - International Society for Optical Engineering. The Journal's web site is located at http://spie.org/x1848.xml?WT.svl=mddp2
Citation
The 2016 SPIE Photonics West Conference, San Francisco, CA., 13-18 February 2016. In Proceedings of SPIE, 2016, v. 9768, article no. 97680K How to Cite?
AbstractThe emission profiles of light-emitting diodes have typically be measured by goniophotometry. However this technique suffers from several drawbacks, including the inability to generate three-dimensional intensity profiles as well as poor spatial resolution. These limitations are particularly pronounced when the technique is used to compared devices whose emission patterns have been modified through surface texturing at the micrometer and nanometer scales,. In view of such limitations, confocal microscopy has been adopted for the study of emission characteristics of LEDs. This enables three-dimensional emission maps to be collected, from which two-dimensional cross-sectional emission profiles can be generated. Of course, there are limitations associated with confocal microscopy, including the range of emission angles that can be measured due to the limited acceptance angle of the objective. As an illustration, the technique has been adopted to compare the emission profiles of LEDs with different divergence angles using an objective with a numerical aperture of 0.8. It is found that the results are consistent with those obtained by goniophotometry when the divergence angle is less that the acceptance angle of the objective. © (2016) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE).
DescriptionSPIE OPTO - part of SPIE Photonics West
Vol 9768: Light-Emitting Diodes: Materials, Devices, and Applications for Solid State Lighting XX
Session 4 - Novel Technologies for LED Design and Fabrication 1: paper 9726-18
Persistent Identifierhttp://hdl.handle.net/10722/232275
ISSN
2020 SCImago Journal Rankings: 0.192
ISI Accession Number ID

 

DC FieldValueLanguage
dc.contributor.authorCheung, WS-
dc.contributor.authorChoi, HW-
dc.date.accessioned2016-09-20T05:28:54Z-
dc.date.available2016-09-20T05:28:54Z-
dc.date.issued2016-
dc.identifier.citationThe 2016 SPIE Photonics West Conference, San Francisco, CA., 13-18 February 2016. In Proceedings of SPIE, 2016, v. 9768, article no. 97680K-
dc.identifier.issn0277-786X-
dc.identifier.urihttp://hdl.handle.net/10722/232275-
dc.descriptionSPIE OPTO - part of SPIE Photonics West-
dc.descriptionVol 9768: Light-Emitting Diodes: Materials, Devices, and Applications for Solid State Lighting XX-
dc.descriptionSession 4 - Novel Technologies for LED Design and Fabrication 1: paper 9726-18-
dc.description.abstractThe emission profiles of light-emitting diodes have typically be measured by goniophotometry. However this technique suffers from several drawbacks, including the inability to generate three-dimensional intensity profiles as well as poor spatial resolution. These limitations are particularly pronounced when the technique is used to compared devices whose emission patterns have been modified through surface texturing at the micrometer and nanometer scales,. In view of such limitations, confocal microscopy has been adopted for the study of emission characteristics of LEDs. This enables three-dimensional emission maps to be collected, from which two-dimensional cross-sectional emission profiles can be generated. Of course, there are limitations associated with confocal microscopy, including the range of emission angles that can be measured due to the limited acceptance angle of the objective. As an illustration, the technique has been adopted to compare the emission profiles of LEDs with different divergence angles using an objective with a numerical aperture of 0.8. It is found that the results are consistent with those obtained by goniophotometry when the divergence angle is less that the acceptance angle of the objective. © (2016) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE).-
dc.languageeng-
dc.publisherSPIE - International Society for Optical Engineering. The Journal's web site is located at http://spie.org/x1848.xml?WT.svl=mddp2-
dc.relation.ispartofProceedings of SPIE-
dc.rightsCopyright 2016 Society of Photo‑Optical Instrumentation Engineers (SPIE). One print or electronic copy may be made for personal use only. Systematic reproduction and distribution, duplication of any material in this publication for a fee or for commercial purposes, and modification of the contents of the publication are prohibited. This article is available online at https://doi.org/10.1117/12.2213111-
dc.subjectConfocal microscopy-
dc.subjectLight-emitting diodes-
dc.titleEmission characteristics of light-emitting diodes by confocal microscopy-
dc.typeConference_Paper-
dc.identifier.emailChoi, HW: hwchoi@hku.hk-
dc.identifier.authorityChoi, HW=rp00108-
dc.description.naturepublished_or_final_version-
dc.identifier.doi10.1117/12.2213111-
dc.identifier.scopuseid_2-s2.0-84978732077-
dc.identifier.hkuros263486-
dc.identifier.volume9768-
dc.identifier.spagearticle no. 97680K-
dc.identifier.epagearticle no. 97680K-
dc.identifier.isiWOS:000378432300006-
dc.publisher.placeUnited States-
dc.identifier.issnl0277-786X-

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