File Download
Links for fulltext
(May Require Subscription)
- Publisher Website: 10.1109/ICALT.2013.179
- Scopus: eid_2-s2.0-84885224328
- WOS: WOS:000333902700138
Supplementary
- Citations:
- Appears in Collections:
Conference Paper: IClass assessment: a pen-based assessment and feedback platform
Title | IClass assessment: a pen-based assessment and feedback platform |
---|---|
Authors | |
Keywords | Cloud-based Learning and Assessment Future Classroom Learning Analystics School of the Future |
Issue Date | 2013 |
Publisher | IEEE Computer Society. The Journal's web site is located at http://ieeexplore.ieee.org/xpl/conhome.jsp?punumber=1000009 |
Citation | The IEEE 13th International Conference on Advanced Learning Technologies (ICALT 2013), Beijing, China, 15-18 July 2013. In Conference Proceedings, 2013, p. 467-468 How to Cite? |
Abstract | In recent years, the demand of in-class interaction and assessment for learning is rising. There is more emphasis on using electronic tools for assessment for learning in order to facilitate teachers seeking to identify and diagnose student learning problems, and providing quality feedback for students on how to improve their work. This paper discusses the challenges of e-assessment and introduced a pen-based assessment and feedback platform developed in Hong Kong. The platform can provide an efficient and effective channel for providing feedback so as to monitor any learning difficulties and help teachers to diagnose students' prior skills and abilities, providing feedback for them to adjust the curriculum or provide additional assistance accordingly. © 2013 IEEE. |
Persistent Identifier | http://hdl.handle.net/10722/189900 |
ISBN | |
ISI Accession Number ID |
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Fok, WWT | en_US |
dc.contributor.author | Chan, CKY | en_US |
dc.date.accessioned | 2013-09-17T15:01:10Z | - |
dc.date.available | 2013-09-17T15:01:10Z | - |
dc.date.issued | 2013 | en_US |
dc.identifier.citation | The IEEE 13th International Conference on Advanced Learning Technologies (ICALT 2013), Beijing, China, 15-18 July 2013. In Conference Proceedings, 2013, p. 467-468 | en_US |
dc.identifier.isbn | 978-0-7695-5009-1 | - |
dc.identifier.uri | http://hdl.handle.net/10722/189900 | - |
dc.description.abstract | In recent years, the demand of in-class interaction and assessment for learning is rising. There is more emphasis on using electronic tools for assessment for learning in order to facilitate teachers seeking to identify and diagnose student learning problems, and providing quality feedback for students on how to improve their work. This paper discusses the challenges of e-assessment and introduced a pen-based assessment and feedback platform developed in Hong Kong. The platform can provide an efficient and effective channel for providing feedback so as to monitor any learning difficulties and help teachers to diagnose students' prior skills and abilities, providing feedback for them to adjust the curriculum or provide additional assistance accordingly. © 2013 IEEE. | - |
dc.language | eng | en_US |
dc.publisher | IEEE Computer Society. The Journal's web site is located at http://ieeexplore.ieee.org/xpl/conhome.jsp?punumber=1000009 | en_US |
dc.relation.ispartof | International Conference on Advanced Learning Technologies (IWALT) Proceedings | en_US |
dc.subject | Cloud-based Learning and Assessment | - |
dc.subject | Future Classroom | - |
dc.subject | Learning Analystics | - |
dc.subject | School of the Future | - |
dc.title | IClass assessment: a pen-based assessment and feedback platform | en_US |
dc.type | Conference_Paper | en_US |
dc.identifier.email | Fok, WWT: wilton@hkucc.hku.hk | en_US |
dc.identifier.email | Chan, CKY: cecilia.chan@caut.hku.hk | en_US |
dc.identifier.authority | Fok, WWT=rp00116 | en_US |
dc.identifier.authority | Chan, CKY=rp00892 | en_US |
dc.description.nature | link_to_subscribed_fulltext | - |
dc.identifier.doi | 10.1109/ICALT.2013.179 | - |
dc.identifier.scopus | eid_2-s2.0-84885224328 | - |
dc.identifier.hkuros | 224167 | en_US |
dc.identifier.spage | 467 | - |
dc.identifier.epage | 468 | - |
dc.identifier.isi | WOS:000333902700138 | - |
dc.publisher.place | United States | en_US |
dc.customcontrol.immutable | sml 131101 | - |