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Conference Paper: Effect of Annealing Temperature on Microstructural and Magnetic Properties of FePt Capped with Ion-Beam Deposited TaOx
Title | Effect of Annealing Temperature on Microstructural and Magnetic Properties of FePt Capped with Ion-Beam Deposited TaOx |
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Authors | |
Issue Date | 2012 |
Citation | The 38th International Conference on Micro and Nano Engineering (MNE 2012), Toulouse, France, 16-20 September 2012, Poster Session: no. 147 How to Cite? |
Abstract | The effect of the annealing on the FePt/TaOx bilayers was systemically studied in this paper. |
Persistent Identifier | http://hdl.handle.net/10722/186764 |
DC Field | Value | Language |
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dc.contributor.author | Li, G | en_US |
dc.contributor.author | Leung, CW | en_US |
dc.contributor.author | Chen, YC | en_US |
dc.contributor.author | Sun, AC | en_US |
dc.contributor.author | Hsu, JH | en_US |
dc.contributor.author | Lai, PT | en_US |
dc.contributor.author | Lin, KW | en_US |
dc.contributor.author | Pong, PWT | en_US |
dc.date.accessioned | 2013-08-20T12:19:26Z | - |
dc.date.available | 2013-08-20T12:19:26Z | - |
dc.date.issued | 2012 | en_US |
dc.identifier.citation | The 38th International Conference on Micro and Nano Engineering (MNE 2012), Toulouse, France, 16-20 September 2012, Poster Session: no. 147 | en_US |
dc.identifier.uri | http://hdl.handle.net/10722/186764 | - |
dc.description.abstract | The effect of the annealing on the FePt/TaOx bilayers was systemically studied in this paper. | - |
dc.language | eng | en_US |
dc.relation.ispartof | International Conference on Micro and Nano Engineering, MNE 2012 | en_US |
dc.title | Effect of Annealing Temperature on Microstructural and Magnetic Properties of FePt Capped with Ion-Beam Deposited TaOx | en_US |
dc.type | Conference_Paper | en_US |
dc.identifier.email | Lai, PT: laip@eee.hku.hk | en_US |
dc.identifier.email | Pong, PWT: ppong@eee.hku.hk | en_US |
dc.identifier.authority | Lai, PT=rp00130 | en_US |
dc.identifier.authority | Pong, PWT=rp00217 | en_US |
dc.identifier.hkuros | 220221 | en_US |