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Conference Paper: Improved performance of low-voltage pentacene OTFTs by incorporating la to hafinium oxide gate dielectric

TitleImproved performance of low-voltage pentacene OTFTs by incorporating la to hafinium oxide gate dielectric
Authors
KeywordsDielectric
HfLaO
HfO 2
High k
OTFT
Issue Date2010
Citation
2010 Ieee International Conference Of Electron Devices And Solid-State Circuits, Edssc 2010, 2010 How to Cite?
AbstractPentacene OTFTs with HfLaO or HfO 2 as gate dielectric were fabricated. The dielectrics were prepared by sputtering method and then annealed in NH 3 at 400 °C. The k value for the HfLaO and HfO 2 films amounted to 12.3 and 11.8 respectively. Both of the OTFTs could operate with a supply voltage of -5 V. The mobility of the OTFT with HfLaO gate dielectric was 0.688 cm 2/Vs, which was much higher than that of the OTFT with HfO 2 gate dielectric. Moreover, the HfLaO-based OTFT obtained smaller sub-threshold swing, larger drive current and larger on/off current ratio than the HfO 2-baesd OTFT. The superior performance of the HfLaO-based OTFT is due to its better interfacial characteristics between the dielectric and the organic semiconductor. SEM images revealed that the pentacene film on HfLaO was more uniform and its grains were larger. C-V measurement indicated that Au-pentacene-HfLaO-Si structure displayed less hysteresis than Au-pentacene-HfO 2-Si structure. © 2010 IEEE.
Persistent Identifierhttp://hdl.handle.net/10722/158694
References

 

DC FieldValueLanguage
dc.contributor.authorDeng, LFen_HK
dc.contributor.authorLai, PTen_HK
dc.contributor.authorTao, QBen_HK
dc.contributor.authorChoi, HWen_HK
dc.contributor.authorXu, JPen_HK
dc.contributor.authorChen, WBen_HK
dc.contributor.authorChe, CMen_HK
dc.contributor.authorLiu, YRen_HK
dc.date.accessioned2012-08-08T09:00:53Z-
dc.date.available2012-08-08T09:00:53Z-
dc.date.issued2010en_HK
dc.identifier.citation2010 Ieee International Conference Of Electron Devices And Solid-State Circuits, Edssc 2010, 2010en_US
dc.identifier.urihttp://hdl.handle.net/10722/158694-
dc.description.abstractPentacene OTFTs with HfLaO or HfO 2 as gate dielectric were fabricated. The dielectrics were prepared by sputtering method and then annealed in NH 3 at 400 °C. The k value for the HfLaO and HfO 2 films amounted to 12.3 and 11.8 respectively. Both of the OTFTs could operate with a supply voltage of -5 V. The mobility of the OTFT with HfLaO gate dielectric was 0.688 cm 2/Vs, which was much higher than that of the OTFT with HfO 2 gate dielectric. Moreover, the HfLaO-based OTFT obtained smaller sub-threshold swing, larger drive current and larger on/off current ratio than the HfO 2-baesd OTFT. The superior performance of the HfLaO-based OTFT is due to its better interfacial characteristics between the dielectric and the organic semiconductor. SEM images revealed that the pentacene film on HfLaO was more uniform and its grains were larger. C-V measurement indicated that Au-pentacene-HfLaO-Si structure displayed less hysteresis than Au-pentacene-HfO 2-Si structure. © 2010 IEEE.en_HK
dc.languageengen_US
dc.relation.ispartof2010 IEEE International Conference of Electron Devices and Solid-State Circuits, EDSSC 2010en_HK
dc.subjectDielectricen_HK
dc.subjectHfLaOen_HK
dc.subjectHfO 2en_HK
dc.subjectHigh ken_HK
dc.subjectOTFTen_HK
dc.titleImproved performance of low-voltage pentacene OTFTs by incorporating la to hafinium oxide gate dielectricen_HK
dc.typeConference_Paperen_HK
dc.identifier.emailLai, PT:laip@eee.hku.hken_HK
dc.identifier.emailChoi, HW:hwchoi@eee.hku.hken_HK
dc.identifier.emailChe, CM:cmche@hku.hken_HK
dc.identifier.authorityLai, PT=rp00130en_HK
dc.identifier.authorityChoi, HW=rp00108en_HK
dc.identifier.authorityChe, CM=rp00670en_HK
dc.description.naturelink_to_subscribed_fulltexten_US
dc.identifier.doi10.1109/EDSSC.2010.5713771en_HK
dc.identifier.scopuseid_2-s2.0-79952520928en_HK
dc.relation.referenceshttp://www.scopus.com/mlt/select.url?eid=2-s2.0-79952520928&selection=ref&src=s&origin=recordpageen_HK
dc.identifier.scopusauthoridDeng, LF=25936092200en_HK
dc.identifier.scopusauthoridLai, PT=7202946460en_HK
dc.identifier.scopusauthoridTao, QB=37058027100en_HK
dc.identifier.scopusauthoridChoi, HW=7404334877en_HK
dc.identifier.scopusauthoridXu, JP=35754128700en_HK
dc.identifier.scopusauthoridChen, WB=23982219600en_HK
dc.identifier.scopusauthoridChe, CM=7102442791en_HK
dc.identifier.scopusauthoridLiu, YR=36062331200en_HK

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