File Download

There are no files associated with this item.

  Links for fulltext
     (May Require Subscription)
Supplementary

Conference Paper: Defect detection in textured materials using Gabor filters

TitleDefect detection in textured materials using Gabor filters
Authors
KeywordsComputer Vision
Defect Detection
Gabor Filters
Gabor Wavelets, Industrial Automation
Multichannel Filtering
Quality Assurance
Textile Industry
Issue Date2002
Citation
Ieee Transactions On Industry Applications, 2002, v. 38 n. 2, p. 425-440 How to Cite?
AbstractThis paper investigates various approaches for automated inspection of textured materials using Gabor wavelet features. A new supervised defect detection approach to detect a class of defects in textile webs is proposed. Unsupervised web inspection using multichannel filtering scheme is investigated. A new data fusion scheme to multiplex the information from the different channels is proposed. Various factors interacting the tradeoff for performance and computational load are discussed. This scheme establishes high computational savings over the previously proposed approaches and results in high quality of defect detection. Final acceptance of visual inspection systems depends on economical aspects as well. Therefore, a new low-cost solution for fast web inspection is also included in this paper. The experimental results conducted on real fabric defects for various approaches proposed in this paper confirm their usefulness.
Persistent Identifierhttp://hdl.handle.net/10722/158344
ISSN
2021 Impact Factor: 4.079
2020 SCImago Journal Rankings: 1.190
ISI Accession Number ID
References

 

DC FieldValueLanguage
dc.contributor.authorKumar, Aen_US
dc.contributor.authorPang, GKHen_US
dc.date.accessioned2012-08-08T08:59:09Z-
dc.date.available2012-08-08T08:59:09Z-
dc.date.issued2002en_US
dc.identifier.citationIeee Transactions On Industry Applications, 2002, v. 38 n. 2, p. 425-440en_US
dc.identifier.issn0093-9994en_US
dc.identifier.urihttp://hdl.handle.net/10722/158344-
dc.description.abstractThis paper investigates various approaches for automated inspection of textured materials using Gabor wavelet features. A new supervised defect detection approach to detect a class of defects in textile webs is proposed. Unsupervised web inspection using multichannel filtering scheme is investigated. A new data fusion scheme to multiplex the information from the different channels is proposed. Various factors interacting the tradeoff for performance and computational load are discussed. This scheme establishes high computational savings over the previously proposed approaches and results in high quality of defect detection. Final acceptance of visual inspection systems depends on economical aspects as well. Therefore, a new low-cost solution for fast web inspection is also included in this paper. The experimental results conducted on real fabric defects for various approaches proposed in this paper confirm their usefulness.en_US
dc.languageengen_US
dc.relation.ispartofIEEE Transactions on Industry Applicationsen_US
dc.subjectComputer Visionen_US
dc.subjectDefect Detectionen_US
dc.subjectGabor Filtersen_US
dc.subjectGabor Wavelets, Industrial Automationen_US
dc.subjectMultichannel Filteringen_US
dc.subjectQuality Assuranceen_US
dc.subjectTextile Industryen_US
dc.titleDefect detection in textured materials using Gabor filtersen_US
dc.typeConference_Paperen_US
dc.identifier.emailPang, GKH:gpang@eee.hku.hken_US
dc.identifier.authorityPang, GKH=rp00162en_US
dc.description.naturelink_to_subscribed_fulltexten_US
dc.identifier.doi10.1109/28.993164en_US
dc.identifier.scopuseid_2-s2.0-0036505674en_US
dc.relation.referenceshttp://www.scopus.com/mlt/select.url?eid=2-s2.0-0036505674&selection=ref&src=s&origin=recordpageen_US
dc.identifier.volume38en_US
dc.identifier.issue2en_US
dc.identifier.spage425en_US
dc.identifier.epage440en_US
dc.identifier.isiWOS:000174631000007-
dc.publisher.placeUnited Statesen_US
dc.identifier.scopusauthoridKumar, A=35198218300en_US
dc.identifier.scopusauthoridPang, GKH=7103393283en_US
dc.identifier.citeulike6008049-
dc.identifier.issnl0093-9994-

Export via OAI-PMH Interface in XML Formats


OR


Export to Other Non-XML Formats