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Patent History
- ApplicationUS 09/144588 2001-10-25
- PublicationUS 20030081215 2003-05-01
- GrantedUS 6753965 2004-06-22
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granted patent: Defect Detection System For Quality Assurance Using Automated Visual Inspection
Title | Defect Detection System For Quality Assurance Using Automated Visual Inspection |
---|---|
Granted Patent | US 6753965 |
Granted Date | 2004-06-22 |
Priority Date | 2001-10-25 US 09/144588 2001-01-09 US 09/260520P |
Inventors | |
Issue Date | 2004 |
Citation | US Patent 6753965. Washington, DC: US Patent and Trademark Office (USPTO), 2004 How to Cite? |
Abstract | A Defect Detection Method And System For The Automated Visual Inspection Of Web Materials Is Provided. The Invention Utilize Real Gabor Function (Rgf) Filters With A Non-Linear Function For Estimating The Local Energy. An Example Method For Quality Assurance Using Automated Visual Inspection In Accordance With The Invention Includes The Steps Of: Automated Design Of A Bank Of Rgf Filters; Using These Rgf Filters To Sample The Features Of Image Under Inspection; Using A Non-Linear Function To Compute Local Energy Estimate In The Filtered Images; Combining All The Filtered Images Using Image Fusion; And Finally Thresholding The Resultant Image To Segment The Defects In The Inspection Image. Possible Embodiments Of The Described Invention Include Detection Of Only A Class Of Defects Using A Single Tuned Real Gabor Filter Or A Bank Of Real Gabor Functions. |
Persistent Identifier | http://hdl.handle.net/10722/142133 |
References |
DC Field | Value | Language |
---|---|---|
dc.date.accessioned | 2011-10-19T06:30:05Z | - |
dc.date.available | 2011-10-19T06:30:05Z | - |
dc.date.issued | 2004 | - |
dc.identifier.citation | US Patent 6753965. Washington, DC: US Patent and Trademark Office (USPTO), 2004 | en_HK |
dc.identifier.uri | http://hdl.handle.net/10722/142133 | - |
dc.description.abstract | A Defect Detection Method And System For The Automated Visual Inspection Of Web Materials Is Provided. The Invention Utilize Real Gabor Function (Rgf) Filters With A Non-Linear Function For Estimating The Local Energy. An Example Method For Quality Assurance Using Automated Visual Inspection In Accordance With The Invention Includes The Steps Of: Automated Design Of A Bank Of Rgf Filters; Using These Rgf Filters To Sample The Features Of Image Under Inspection; Using A Non-Linear Function To Compute Local Energy Estimate In The Filtered Images; Combining All The Filtered Images Using Image Fusion; And Finally Thresholding The Resultant Image To Segment The Defects In The Inspection Image. Possible Embodiments Of The Described Invention Include Detection Of Only A Class Of Defects Using A Single Tuned Real Gabor Filter Or A Bank Of Real Gabor Functions. | en_HK |
dc.title | Defect Detection System For Quality Assurance Using Automated Visual Inspection | en_HK |
dc.type | Patent | en_US |
dc.identifier.email | Pang, Grantham Kwok Hung:gpang@eee.hku.hk | en_US |
dc.identifier.authority | Pang, Grantham Kwok Hung=rp00162 | en_US |
dc.description.nature | published_or_final_version | - |
dc.identifier.hkuros | 90405 | en_US |
dc.contributor.inventor | Kumar, A | en_US |
dc.contributor.inventor | Pang, Kwok-hung Grantham | en_US |
patents.identifier.application | US 09/144588 | en_HK |
patents.identifier.granted | US 6753965 | en_HK |
patents.description.assignee | Univ Hong Kong [Us] | en_HK |
patents.description.country | United States of America | en_HK |
patents.date.publication | 2003-05-01 | en_HK |
patents.date.granted | 2004-06-22 | en_HK |
dc.relation.references | US 5301129 (A) 1994-04-05 | en_HK |
dc.relation.references | US 5774177 (A) 1998-06-30 | en_HK |
dc.relation.references | US 4630304 (A) 1986-12-16 | en_HK |
dc.relation.references | US 5737072 (A) 1998-04-07 | en_HK |
dc.relation.references | US 5740048 (A) 1998-04-14 | en_HK |
dc.relation.references | US 5825501 (A) 1998-10-20 | en_HK |
dc.relation.references | EP 0974831 (A2) 2000-01-26 | en_HK |
dc.relation.references | EP 0974831 (A3) 2000-03-22 | en_HK |
dc.relation.references | EP 0974831 (B1) 2005-01-12 | en_HK |
patents.identifier.hkutechid | EEE-2001-00045-1 | en_US |
patents.date.application | 2001-10-25 | en_HK |
patents.date.priority | 2001-10-25 US 09/144588 | en_HK |
patents.date.priority | 2001-01-09 US 09/260520P | en_HK |
patents.description.cc | US | en_HK |
patents.identifier.publication | US 20030081215 | en_HK |
patents.relation.family | US 2003081215 (A1) 2003-05-01 | en_HK |
patents.relation.family | US 6753965 (B2) 2004-06-22 | en_HK |
patents.description.kind | B2 | en_HK |
patents.type | Patent_granted | en_HK |