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Conference Paper: Sensitivity analysis for the transverse displacements of a cracked plate using the spatial wavelet approach

TitleSensitivity analysis for the transverse displacements of a cracked plate using the spatial wavelet approach
Authors
Issue Date2005
PublisherASME.
Citation
Proceedings Of The Asme International Design Engineering Technical Conferences And Computers And Information In Engineering Conference - Detc2005, 2005, v. 1 B, p. 1467-1472 How to Cite?
AbstractIn this paper, the effectiveness of the proposed technique is used for the sensitivity analysis of cracked plates, and verified theoretically and experimentally. The transverse displacements and natural frequencies of cracked plates are obtained using the fractal two-level finite element method The transverse displacements of the cracked plates are then transformed using the spatial wavelet method. The numerical and experimental results have concluded that I) the natural frequencies are not very sensitive to small cracks. The presences of the small cracks and crack locations cannot be identified effectively by examining the natural frequencies; 2) the transformed transverse displacements are more sensitive to the crack extent and change significantly at the crack locations, provided that the wavelet dilation index is high enough (i.e., the wavelet transform resolution is fine enough); 3) however, the experimental results show that if the wavelet dilation index is set too high, the crack locations cannot be detected from the transformed displacements. It is because the plate surface roughness in the experiment cases induces some local variations on the transformed displacement curve to mask the crack location. Copyright © 2005 by ASME.
Persistent Identifierhttp://hdl.handle.net/10722/111181
References

 

DC FieldValueLanguage
dc.contributor.authorSun, HYen_HK
dc.contributor.authorLee, YYen_HK
dc.contributor.authorLam, HFen_HK
dc.contributor.authorSu, RKLen_HK
dc.date.accessioned2010-09-26T02:38:02Z-
dc.date.available2010-09-26T02:38:02Z-
dc.date.issued2005en_HK
dc.identifier.citationProceedings Of The Asme International Design Engineering Technical Conferences And Computers And Information In Engineering Conference - Detc2005, 2005, v. 1 B, p. 1467-1472en_HK
dc.identifier.urihttp://hdl.handle.net/10722/111181-
dc.description.abstractIn this paper, the effectiveness of the proposed technique is used for the sensitivity analysis of cracked plates, and verified theoretically and experimentally. The transverse displacements and natural frequencies of cracked plates are obtained using the fractal two-level finite element method The transverse displacements of the cracked plates are then transformed using the spatial wavelet method. The numerical and experimental results have concluded that I) the natural frequencies are not very sensitive to small cracks. The presences of the small cracks and crack locations cannot be identified effectively by examining the natural frequencies; 2) the transformed transverse displacements are more sensitive to the crack extent and change significantly at the crack locations, provided that the wavelet dilation index is high enough (i.e., the wavelet transform resolution is fine enough); 3) however, the experimental results show that if the wavelet dilation index is set too high, the crack locations cannot be detected from the transformed displacements. It is because the plate surface roughness in the experiment cases induces some local variations on the transformed displacement curve to mask the crack location. Copyright © 2005 by ASME.en_HK
dc.languageengen_HK
dc.publisherASME.en_HK
dc.relation.ispartofProceedings of the ASME International Design Engineering Technical Conferences and Computers and Information in Engineering Conference - DETC2005en_HK
dc.titleSensitivity analysis for the transverse displacements of a cracked plate using the spatial wavelet approachen_HK
dc.typeConference_Paperen_HK
dc.identifier.emailSu, RKL:klsu@hkucc.hku.hken_HK
dc.identifier.authoritySu, RKL=rp00072en_HK
dc.description.naturelink_to_subscribed_fulltext-
dc.identifier.scopuseid_2-s2.0-33244470676en_HK
dc.identifier.hkuros117953en_HK
dc.relation.referenceshttp://www.scopus.com/mlt/select.url?eid=2-s2.0-33244470676&selection=ref&src=s&origin=recordpageen_HK
dc.identifier.volume1 Ben_HK
dc.identifier.spage1467en_HK
dc.identifier.epage1472en_HK
dc.identifier.scopusauthoridSun, HY=10144742900en_HK
dc.identifier.scopusauthoridLee, YY=8674977300en_HK
dc.identifier.scopusauthoridLam, HF=7202774985en_HK
dc.identifier.scopusauthoridSu, RKL=7102627096en_HK

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