Showing results 1 to 2 of 2
| Title | Author(s) | Issue Date | |
|---|---|---|---|
Growth and characterization of Al2O3 gate dielectric films by low-pressure metalorganic chemical vapor deposition Proceeding/Conference:Microelectronic Engineering | 2003 | ||
Modification of a YBa<inf>2</inf>Cu<inf>3</inf>O<inf>7-δ</inf> thin film using an atomic force microscope Journal:Chinese Physics Letters | 2002 |