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Article: Modification of a YBa2Cu3O7-δ thin film using an atomic force microscope

TitleModification of a YBa<inf>2</inf>Cu<inf>3</inf>O<inf>7-δ</inf> thin film using an atomic force microscope
Authors
You, Li XingYin, Xiao BoFeng, Yi JunYang, Sen ZuKang, LinWang, MuWu, Pei Heng
Issue Date2002
Citation
Chinese Physics Letters, 2002, v. 19, n. 6, p. 854-856 How to Cite?
DOI: http://dx.doi.org/10.1088/0256-307X/19/6/333
AbstractA YBa2Cu3O7-δ thin film is modified by a probe electric field of an atomic force microscope to form a ridge with the width of only a grain cell. The modification varies with the operation parameters of the bias voltage, the moving velocity of the probe and the ambient humidity. Energy dispersive spectroscopy analysis shows only oxygen deficiency in the modified YBCO thin film. As a result, the suppressed superconductivity was found in the junction crossing the ridge.
Persistent Identifierhttp://hdl.handle.net/10722/310358
ISSN
0256-307X
2023 Impact Factor: 3.5
2023 SCImago Journal Rankings: 0.815

 

DC FieldValueLanguage
dc.contributor.authorYou, Li Xing-
dc.contributor.authorYin, Xiao Bo-
dc.contributor.authorFeng, Yi Jun-
dc.contributor.authorYang, Sen Zu-
dc.contributor.authorKang, Lin-
dc.contributor.authorWang, Mu-
dc.contributor.authorWu, Pei Heng-
dc.date.accessioned2022-01-31T06:04:41Z-
dc.date.available2022-01-31T06:04:41Z-
dc.date.issued2002-
dc.identifier.citationChinese Physics Letters, 2002, v. 19, n. 6, p. 854-856-
dc.identifier.issn0256-307X-
dc.identifier.urihttp://hdl.handle.net/10722/310358-
dc.description.abstractA YBa2Cu3O7-δ thin film is modified by a probe electric field of an atomic force microscope to form a ridge with the width of only a grain cell. The modification varies with the operation parameters of the bias voltage, the moving velocity of the probe and the ambient humidity. Energy dispersive spectroscopy analysis shows only oxygen deficiency in the modified YBCO thin film. As a result, the suppressed superconductivity was found in the junction crossing the ridge.-
dc.languageeng-
dc.relation.ispartofChinese Physics Letters-
dc.titleModification of a YBa<inf>2</inf>Cu<inf>3</inf>O<inf>7-δ</inf> thin film using an atomic force microscope-
dc.typeArticle-
dc.description.naturelink_to_subscribed_fulltext-
dc.identifier.doi10.1088/0256-307X/19/6/333-
dc.identifier.scopuseid_2-s2.0-0035997665-
dc.identifier.volume19-
dc.identifier.issue6-
dc.identifier.spage854-
dc.identifier.epage856-

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