Showing results 1 to 3 of 3
Title | Author(s) | Issue Date | |
---|---|---|---|
Advisor(s):Lai, PT | 2021 | ||
1-Nov-2022 | |||
Impact of Gate-Dielectric Annealing Temperature on Screening of Remote Phonon Scattering in InGaZnO Thin-Film Transistors Journal:IEEE Transactions on Electron Devices | 31-Aug-2022 |