Showing results 1 to 4 of 4
| Title | Author(s) | Issue Date | |
|---|---|---|---|
Degradation of SiC MOSFETs Under High-Bias Switching Events Journal:IEEE Journal of Emerging and Selected Topics in Power Electronics | 2022 | ||
Packaging of a 10-kV Double-Side Cooled Silicon Carbide Diode Module With Thin Substrates Coated by a Nonlinear Resistive Polymer-Nanoparticle Composite Journal:IEEE Transactions on Power Electronics | 2022 | ||
Physics of Degradation in SiC MOSFETs Stressed by Overvoltage and Overcurrent Switching Proceeding/Conference:IEEE International Reliability Physics Symposium Proceedings | 2020 | ||
Robustness Evaluation and Degradation Mechanisms of SiC MOSFETs Overstressed by Switched Stimuli Proceeding/Conference:Conference Proceedings - IEEE Applied Power Electronics Conference and Exposition - APEC | 2020 |