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Title | Author(s) | Issue Date | |
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Drain current collapse in nanoscaled bulk MOSFETs due to random dopant compensation in the source/drain extensions Journal:IEEE Transactions on Electron Devices | 2011 |
Title | Author(s) | Issue Date | |
---|---|---|---|
Drain current collapse in nanoscaled bulk MOSFETs due to random dopant compensation in the source/drain extensions Journal:IEEE Transactions on Electron Devices | 2011 |