Showing results 15 to 28 of 28
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Title | Author(s) | Issue Date | |
---|---|---|---|
Near infrared laser spectroscopy of CrS Proceeding/Conference:55th Ohio State University International Symposium on Molecular Spectroscopy, Columbus, OH, USA, June 12-16 | 2000 | ||
Near infrared laser spectroscopy of FeC Journal:Chemical Physics Letters | 2001 | ||
Near infrared laser spectroscopy of NiI Proceeding/Conference:59th Ohio State University International Symposium on Molecular Sectroscopy, U.S.A., June 21-25, 2004, TB08 | 2004 | ||
Near infrared laser spectroscopy of TiS and VS Proceeding/Conference:IAU Symposium 197, Astrochemistry: From Molecular Clouds to Planetary Systems, Cheju Island, Korea, August 23-27 | 1999 | ||
Near infrared laser spectroscopy of titanium sulfide Proceeding/Conference:54th Ohio State University International Symposium on Molecular Spectroscopy, June 14-18 | 1999 | ||
Near infrared spectroscopy of CoI Proceeding/Conference:American Chemistry Society National Meeting | 2003 | ||
Near-infrared laser spectroscopy of Nil Journal:Journal of Chemical Physics | 2004 | ||
Near-Infrared Laser Spectroscopy of the C3Δ-X3Δ Transition of TiS Journal:Journal of Molecular Spectroscopy | 1999 | ||
Near-infrared laser spectroscopy of TiS: The b1II-X3Δ transition Journal:Journal of Molecular Spectroscopy | 2000 | ||
Process induced magnetic sensitivity variation in sectorial split-drain magentic field-effect transistor Proceeding/Conference:International Symposium on Next-Generation Electronics (ISNE) | 2014 | ||
Rotational and hyperfine analysis of the near infrared 3Φ4-X3Φ4 transitions of CoCl and Col Journal:Journal of Chemical Physics | 2003 | ||
Sectorial SD-MAGFET for high speed mechatronic applications Proceeding/Conference:International Symposium on Next-Generation Electronics (ISNE) | 2014 | ||
Sensitivity distortion of split-drain MAGFET under alternating magnetic field Proceeding/Conference:TENCON (IEEE Region 10 Conference) Proceedings | 2015 | ||
Split-Drain Magnetic Field-Effect Transistor Channel Charge Trapping and Stress Induced Sensitivity Deterioration Proceeding/Conference:IEEE Transactions on Magnetics | 2014 |