Showing results 1 to 3 of 3
Evaluating acute medical admissions through emergency departments in Hong Kong: Can one adjust for case-mix variation?
Journal:Emergency Medicine Journal
Interplay between statistical reliability and variability: A comprehensive transistor-to-circuit simulation technology
Proceeding/Conference:IEEE International Reliability Physics Symposium Proceedings
New reliability mechanisms in memory design for sub-22nm technologies
Proceeding/Conference:Proceedings of the 2011 IEEE 17th International On-Line Testing Symposium, IOLTS 2011