Showing results 3 to 7 of 7
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Title | Author(s) | Issue Date | |
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From ab initio properties of the Si-SiO2 interface, to electrical characteristics of metal-oxide-semiconductor devices Proceeding/Conference:Journal of Physics: Conference Series | 2010 | ||
Impact of random dopant fluctuations on trap-assisted tunnelling in nanoscale MOSFETs Journal:Microelectronics Reliability | 2012 | ||
Interplay between statistical reliability and variability: A comprehensive transistor-to-circuit simulation technology Proceeding/Conference:IEEE International Reliability Physics Symposium Proceedings | 2013 | ||
New reliability mechanisms in memory design for sub-22nm technologies Proceeding/Conference:Proceedings of the 2011 IEEE 17th International On-Line Testing Symposium, IOLTS 2011 | 2011 | ||
On the sub-nm EOT scaling of high-κ gate stacks Proceeding/Conference:ULIS 2008 - 9th International Conference on ULtimate Integration of Silicon | 2008 |