Showing results 1 to 2 of 2
Title | Author(s) | Issue Date | |
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Atomic level modeling of extremely thin silicon-on-insulator MOSFETs including the silicon dioxide: Electronic structure Journal:IEEE Transactions on Electron Devices | 2015 | ||
Permittivity of oxidized ultra-thin silicon films from atomistic simulations Journal:IEEE Electron Device Letters | 2015 |