Showing results 1 to 6 of 6
Title | Author(s) | Issue Date | |
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An analytical approach for studying diffusion and drift effects of positrons at the metal/semi-insulating GaAs interface Journal:Materials Science Forum | 1997 | ||
2012 | |||
Effects of Y incorporation in TaON gate dielectric on electrical performance of GaAs metal-oxide-semiconductor capacitor Journal:Physica Status Solidi - Rapid Research Letters | 2016 | ||
Improved Electrical Properties and Reliability of GaAs Metal–Oxide–Semiconductor Capacitor by Using LaAlON Passivation Layer Journal:Physica Status Solidi - Rapid Research Letters | 2017 | ||
2016 | |||
The contact and photoconductivity characteristics between Co doped amorphous carbon and GaAs: n-type low-resistivity and semi-insulated high-resistivity GaAs Journal:Semiconductor Science and Technology | 2016 |