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Title | Author(s) | Issue Date | |
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Depth profiling of vacancy-type defects in homogenous and multilayered a-Si films by positron beam Doppler broadening Journal:Journal of Non-Crystalline Solids | 1998 |
Title | Author(s) | Issue Date | |
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Depth profiling of vacancy-type defects in homogenous and multilayered a-Si films by positron beam Doppler broadening Journal:Journal of Non-Crystalline Solids | 1998 |