Showing results 1 to 5 of 5
Title | Author(s) | Issue Date | |
---|---|---|---|
Deep level defects in 6H silicon carbide Journal:物理 | 2004 | ||
Defect identification using positrons Proceeding/Conference:Materials Science Forum | 2001 | ||
Photoluminescence of electron-and neutron-irradiated n-type 6H-SiC Journal:Pan Tao Ti Hsueh Pao/Chinese Journal of Semiconductors | 2006 | ||
Photoluminescence study of beryllium implantation induced intrinsic defects in 6H-silicon carbide Journal:Physica B: Condensed Matter | 2001 | ||
Positron annihilation spectroscopic studies of 6H silicon carbide Proceeding/Conference:Materials Science Forum | 2001 |