Showing results 1 to 7 of 7
| Title | Author(s) | Issue Date | |
|---|---|---|---|
Automatic Segmentation For Visual Inspection In Semiconductor Manufacturing Using Multiscale Morphology Proceeding/Conference:7th International Conference on Quality Control by Artificial Vision | 2005 | ||
Bit-pairing codification for binary pattern projection system Proceeding/Conference:Proceedings - International Conference on Pattern Recognition | 2006 | ||
Boundary detection of projected fringes on surface with inhomogeneous reflectance function Proceeding/Conference:Proceedings of SPIE - The International Society for Optical Engineering | 2006 | ||
An edge detection algorithm based on rectangular gaussian kernels for machine vision applications Proceeding/Conference:Proceedings of SPIE - The International Society for Optical Engineering | 2009 | ||
Handling of multi-reflections in wafer bump 3D reconstruction Proceeding/Conference:Conference Proceedings - IEEE International Conference on Systems, Man and Cybernetics | 2008 | ||
A novel design of grating projection system for 3D reconstruction of wafer bumps Proceeding/Conference:Proceedings of SPIE - The International Society for Optical Engineering | 2006 | ||
A three-dimensional imaging system for surface profilometry of moving objects Proceeding/Conference:IEEE International Workshop on Imaging Systems and Techniques Proceedings | 2013 |